H Hölscher, UD Schwarz - International Journal of Non-linear mechanics, 2007 - Elsevier
The present text reviews the fundamentals of amplitude-modulation atomic force microscopy (AM-AFM), which is frequently also referred to as dynamic force microscopy, non-contact …
S Hu, A Raman - Nanotechnology, 2008 - iopscience.iop.org
Quantifying the tip–sample interaction forces in amplitude-modulated atomic force microscopy (AM-AFM) has been an elusive yet important goal in nanoscale imaging …
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable, and gentle imaging mode with widespread applications …
RW Stark - Nanotechnology, 2003 - iopscience.iop.org
Dynamic atomic force microscopy (AFM) is a standard technique for imaging and the analysis of surfaces at the nanometre scale. In order to estimate material properties from the …
M Lee, W Jhe - Physical review letters, 2006 - APS
We present a general analytical theory that enables one to determine accurately the unknown tip-sample interactions from the experimental measurement of the amplitude and …
Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging and sensing material properties at the nanoscale. The signal level at a given harmonic of the …
Atomic force microscopy (AFM) is a powerful, multifunctional imaging platform that allows biological samples, from single molecules to living cells, to be visualized and manipulated …
R Garcıa, R Perez - Surface science reports, 2002 - Elsevier
In this report we review the fundamentals, applications and future tendencies of dynamic atomic force microscopy (AFM) methods. Our focus is on understanding why the changes …
A mode of atomic force microscopy (AFM) is demonstrated where an oscillating AFM cantilever having linear response is driven with two frequencies in the vicinity of a …