Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …

Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is
seemingly impossible to estimate the tip-sample interactions from the motion of the …

Optical beam deflection is a widely used method for detecting the deflection of atomic force
microscope (AFM) cantilevers. This paper presents a first order derivation for the angular …

Dynamic modes of atomic-force microscopy offer new possibilities for imaging because of
the availability of the various vibrational modes of the probes. However, each mode has a …

In an atomic force microscope (AFM), the force is normally sensed by measuring the
deflection of a cantilever by an optical lever technique. Experimental results show a …

A novel atomic force microscope (AFM) has been developed. Unlike conventional AFM
systems, its cantilever and tip were set up in the X direction with respect to the sample. It can …

The performance of the atomic force microscope (AFM) is underpinned by the properties of
its force-sensing microcantilever. Due to the universal belief that V-shaped cantilevers are …

The force-sensing cantilever in a noncontact atomic force microscope is a continuous
system with infinite number of eigenmodes. Although the frequently used point mass model …

The response time of an atomic force microscopy (AFM) cantilever can be decreased by
reducing cantilever size; however, the fastest AFM cantilevers are currently nearing the …

One of the most important limitations of the atomic force microscopy (AFM) is scanning
speed, whose high values are required for contemporary high-resolution, long-range …