The torsional mode of atomic force microscope (AFM) cantilevers plays a crucial role in a
wide range of sensitive measurements. Despite their importance, the use of approximated …

The advancement of dynamic and multifrequency atomic force microscopy (AFM)
necessitates leveraging the frequency response of cantilevers when it is in contact with the …

Multifrequency atomic force microscopy (AFM) utilizes the multimode operation of
cantilevers to achieve rapid high-resolution imaging and extract multiple properties …

The torsional eigenmodes of atomic force microscope (AFM) cantilevers are highly sensitive
toward in-plane material properties of the sample. We studied the effect of viscosity and …

Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries
of nanotechnology. Fundamental research in atomic interactions, molecular reactions, and …

Combining heated-tip atomic force microscopy (HT-AFM) with quantitative methods for
determining surface mechanical properties, such as contact resonance force microscopy …

We study the influence of the contact stiffness and the ration between cantilever and tip
lengths on the resonance frequencies and sensitivities of lateral cantilever modes. We …

Microcantilevers are at the heart of atomic force microscopy (AFM) and play a significant role
in AFM‐based techniques. Recent advancements in multifrequency AFM require the …

Dynamic techniques exploiting the vibration of atomic force microscope (AFM) cantilevers
are often superior to quasi-static operation, in particular with respect to the signal-to-noise …

Cantilever vibration modes beyond the first harmonic of the standard flexural vibration mode
were intensely explored in atomic force microscopy (AFM) during the past years. One …