Microcantilevers are at the heart of atomic force microscopy (AFM) and play a significant role
in AFM‐based techniques. Recent advancements in multifrequency AFM require the …

The advancement of dynamic and multifrequency atomic force microscopy (AFM)
necessitates leveraging the frequency response of cantilevers when it is in contact with the …

Recently several multi-frequency imaging techniques have been proposed that have
opened up a multitude of information channels to probe surface properties in atomic force …

As the application of atomic force microscopy (AFM) in soft matter characterization has
expanded, the use of different types of cantilevers for these studies have also increased …

The experimental characterisation of a set of microcantilevers targeted at use in multi‐
frequency atomic force microscope is presented. The aim of this work is to design a …

Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide
several distinct advantages over conventional cantilever instrumentation. These include …

A method is presented to enhance the optical lever sensitivity in dynamic atomic force
microscopy (AFM) by nearly an order of magnitude over a wide frequency bandwidth. This is …

During dynamic atomic force microscopy (AFM), the deflection of a scanning cantilever
generates multiple frequency terms due to the nonlinear nature of AFM tip–sample …

Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries
of nanotechnology. Fundamental research in atomic interactions, molecular reactions, and …

Abstract The Atomic Force Microscope (AFM) is a tool for imaging surfaces at the micro and
nano meter scale. The microscope senses the force acting between a surface and a tip …