The advancement of dynamic and multifrequency atomic force microscopy (AFM)
necessitates leveraging the frequency response of cantilevers when it is in contact with the …

Microcantilevers are at the heart of atomic force microscopy (AFM) and play a significant role
in AFM‐based techniques. Recent advancements in multifrequency AFM require the …

Atomic force microscopy (AFM) uses a scanning process performed by a microcantilever
probe to create a three dimensional image of a nano-scale physical surface. The dynamics …

Multifrequency atomic force microscopy (AFM) utilizes the multimode operation of
cantilevers to achieve rapid high-resolution imaging and extract multiple properties …

Mechanical characterization methods at the nanoscale are of critical importance for many
fields including nanomaterials, micro/nano devices and nanomechanics. As a key tool in …

The torsional mode of atomic force microscope (AFM) cantilevers plays a crucial role in a
wide range of sensitive measurements. Despite their importance, the use of approximated …

The detection of higher modes of oscillation in atomic force microscopy can provide
additional information on sample properties. However, the limited bandwidth of the …

Dynamic atomic force microscopy, in essence, consists of a vibrating microcantilever with a
nanoscale tip that interacts with a sample surface via short-and long-range intermolecular …

A method is presented to enhance the optical lever sensitivity in dynamic atomic force
microscopy (AFM) by nearly an order of magnitude over a wide frequency bandwidth. This is …

Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries
of nanotechnology. Fundamental research in atomic interactions, molecular reactions, and …