Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence
of the nonlinear tip-sample interaction force. The higher harmonics contain important …

In tapping-mode atomic-force microscopy usually amplitude and phase of the cantilever
motion are acquired. These signals are related to the fundamental oscillation frequency …

In atomic force microscopy (AFM), high-frequency components consisted in dynamic tip-
sample interaction have been recently demonstrated as a promising technique for exploring …

The natural frequencies of a cantilever probe can be tuned with an attached concentrated
mass to coincide with the higher harmonics generated in a tapping-mode atomic force …

Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …

In atomic force microscopy, a force-sensing cantilever probes a sample and thereby creates
a topographic image of its surface. The simplest implementation uses the static deflection of …

The periodic impact force induced by tip-sample contact in a tapping mode atomic force
microscope (AFM) gives rise to the non-harmonic response of a micro-cantilever. These non …

Higher harmonics have been widely used to characterize nanomechanical properties of the
sample surface in tapping mode atomic force microscopy. They are usually analyzed by the …

In tapping-mode atomic force microscopy, nonlinear tip–sample interactions give rise to
higher harmonics of the cantilever vibration. We present an electrical circuit to model the …

In dynamic atomic force microscopy, nanoscale properties are encoded in the higher
harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required …