The natural frequencies of a cantilever probe can be tuned with an attached concentrated
mass to coincide with the higher harmonics generated in a tapping-mode atomic force …

Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …

We present an experimental analysis of the nonlinear tip–sample interaction in tapping-
mode atomic-force microscopy by exploiting anharmonic contributions of the cantilever …

In this work, we study the performance of a new cantilever design during multi-frequency
tapping mode Atomic Force Microscopy (AFM). The system consists of a base cantilever with …

In a tapping-mode atomic force microscope, the frequency spectrum of the oscillating
cantilever contains higher harmonics at integer multiples of the excitation frequency. When …

Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in
nanomechanical mapping of materials with atomic resolution. In this work, we develop an …

In tapping-mode atomic force microscopy, nonlinear tip–sample interactions give rise to
higher harmonics of the cantilever vibration. We present an electrical circuit to model the …

Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence
of the nonlinear tip-sample interaction force. The higher harmonics contain important …

During dynamic atomic force microscopy (AFM), the deflection of a scanning cantilever
generates multiple frequency terms due to the nonlinear nature of AFM tip–sample …

In atomic force microscopy (AFM), high-frequency components consisted in dynamic tip-
sample interaction have been recently demonstrated as a promising technique for exploring …