Using a simple model, we investigated the contributions of both the frictional force and the
normal reacting force to the topography and the lateral force observed with an atomic …

In this letter, a method to calibrate sensitivity for the three‐dimensional displacement of X, Y,
and Z directions by using the novel force curve, namely lateral force curve, as well as vertical …

Using a simple model, we investigated the difference between the forces measured by an
atomic force microscope (AFM) with an optical lever deflection method and that with an …

The goal of atomic force microscopy (AFM) is to measure the short-range forces that act
between the tip and the surface. The signal recorded, however, includes long-range forces …

Since the first lateral force measurements by atomic force microscopy, one of the main
obstacles to quantitative friction-force measurements has been the difficulty in measuring the …

A proof-of-concept study is presented for a prototype atomic force microscope (AFM)
cantilever and associated calibration procedure that provide a path for quantitative friction …

The quantitative use of atomic force microscopes in lateral mode for friction measurements
has been limited by uncertainty about reliable calibration techniques. This article describes …

In atomic force and frictional force microscopy, quantitative interpretation of lateral stiffness
at the tip-sample contact requires a detailed understanding of all factors contributing to the …

Among near field microscopes, the atomic force microscope (AFM) is a powerful and
versatile tool for investigating local mechanical properties, friction and adhesiveness …

The prospect of a robust three-dimensional atomic force microscope (AFM) holds significant
promise in nanoscience. Yet, in conventional AFM, the tip–sample interaction force vector is …