Theory of high-NA imaging in homogeneous thin films

DG Flagello, T Milster, AE Rosenbluth - JOSA A, 1996 - opg.optica.org
A description is given of a modeling technique that is used to explore three-dimensional
image distributions formed by high numerical aperture (NA> 0.6) lenses in homogeneous …

Magneto-optical sensitivity functions of thin-film systems

A Hubert, G Traeger - Journal of magnetism and magnetic materials, 1993 - Elsevier
The dependence of magneto-optical effects on the magnetization distribution in a magnetic
film system can be described by sensitivity functions or information depth profiles [1]. These …

Magneto‐optic scattering from thin solid films

RP Hunt - Journal of Applied Physics, 1967 - pubs.aip.org
A general theory for treating magneto‐optic scattering (reflection and transmission) from
multilayer structures comprised of magneto‐optic and dielectric materials is presented. The …

Universal approach to magneto-optics

J Zak, ER Moog, C Liu, SD Bader - Journal of Magnetism and Magnetic …, 1990 - Elsevier
Magneto-optics is described in a unique framework. Reflection and transmission of a
general multilayer system is expressed by means of medium boundary and propagation …

Imaging, compression and Poynting vector streamlines for negative permittivity materials

E Shamonina, VA Kalinin, KH Ringhofer… - Electronics …, 2001 - search.proquest.com
The quality of imaging subwavelength features with the aid of multilayers containing
negative permittivity materials is examined. Examples for nearly perfect imaging are given …

Analysis of multilayer thin‐film structures containing magneto‐optic and anisotropic media at oblique incidence using 2× 2 matrices

M Mansuripur - Journal of Applied Physics, 1990 - pubs.aip.org
A complete analysis of multilayer structures containing an arbitrary number of dielectric,
metal, magnetic, and birefringent/dichroic layers is presented. An algorithm, based on …

Electric fields in multilayers at oblique incidence

JH Apfel - Applied Optics, 1976 - opg.optica.org
The recursion equation for electric field strength in a multilayer thin film system yields only
the tangential component of the field. This paper discusses the relationship between the …

General analytical treatment of optics in layered structures: Application to magneto-optics

P Bertrand, C Hermann, G Lampel, J Peretti, VI Safarov - Physical Review B, 2001 - APS
We have derived compact and interpretable analytical expressions to describe the magneto-
optics in layered structures for all orientations of magnetization and incident angle. In our …

Degree of polarization in tightly focused optical fields

K Lindfors, T Setälä, M Kaivola, AT Friberg - JOSA A, 2005 - opg.optica.org
We analyze the degree of polarization of random, statistically stationary electromagnetic
fields in the focal region of a high-numerical-aperture imaging system. The Richards–Wolf …

Submicron imaging with a planar silver lens

DOS Melville, RJ Blaikie, CR Wolf - Applied Physics Letters, 2004 - pubs.aip.org
Optical imaging through a thin planar silver layer has been achieved by utilizing near-field
lithography techniques. A 120 nm thick silver lens that was placed 60 nm below a patterned …