Characterizing dielectric tensors from angle-of-incidence Mueller matrix images
PK Smith, RA Chipman - Polarization Science and Remote …, 2007 - spiedigitallibrary.org
Biaxial ellipsometry is a technique that measures the dielectric tensor and thickness of a
biaxial substrate, single-layer thin film, or multi-layer structure. The dielectric tensor of a …
biaxial substrate, single-layer thin film, or multi-layer structure. The dielectric tensor of a …
Characterizing dielectric tensors from angle-of-incidence Mueller matrix images
PK Smith, RA Chipman - Polarization Science and Remote …, 2007 - ui.adsabs.harvard.edu
Biaxial ellipsometry is a technique that measures the dielectric tensor and thickness of a
biaxial substrate, single-layer thin film, or multi-layer structure. The dielectric tensor of a …
biaxial substrate, single-layer thin film, or multi-layer structure. The dielectric tensor of a …
Characterizing dielectric tensors from angle-of-incidence Mueller matrix images
P Smith, R Chipman - Proc. of SPIE Vol - spiedigitallibrary.org
Biaxial ellipsometry is a technique that measures the dielectric tensor and thickness of a
biaxial substrate, single-layer thin film, or multi-layer structure. The dielectric tensor of a …
biaxial substrate, single-layer thin film, or multi-layer structure. The dielectric tensor of a …
[引用][C] Characterizing Dielectric Tensors from Angle-Of-Incidence Mueller Matrix Images
PK SMITH, RA CHIPMAN - Proceedings of SPIE, the …, 2007 - pascal-francis.inist.fr
Characterizing Dielectric Tensors from Angle-Of-Incidence Mueller Matrix Images CNRS Inist
Pascal-Francis CNRS Pascal and Francis Bibliographic Databases Simple search Advanced …
Pascal-Francis CNRS Pascal and Francis Bibliographic Databases Simple search Advanced …