Dielectric tensor measurement from a single Mueller matrix image
NA Beaudry, Y Zhao, R Chipman - JOSA A, 2007 - opg.optica.org
A technique for measuring dielectric tensors in anisotropic layered structures, such as thin
films of biaxial materials, is demonstrated. The ellipsometric data are collected in a quasi …
films of biaxial materials, is demonstrated. The ellipsometric data are collected in a quasi …
Dielectric tensor measurement from a single Mueller matrix image
NA Beaudry, Y Zhao, R Chipman - opg.optica.org
Ellipsometry is a well-established technique for determining optical properties such as
refractive indices, absorption coefficients, and film thicknesses of material samples by …
refractive indices, absorption coefficients, and film thicknesses of material samples by …
[PDF][PDF] Dielectric tensor measurement from a single Mueller matrix image
NA Beaudry, Y Zhao, R Chipman - researchgate.net
Ellipsometry is a well-established technique for determining optical properties such as
refractive indices, absorption coefficients, and film thicknesses of material samples by …
refractive indices, absorption coefficients, and film thicknesses of material samples by …
Dielectric tensor measurement from a single Mueller matrix image
NA Beaudry, Y Zhao… - Journal of the Optical …, 2007 - pubmed.ncbi.nlm.nih.gov
A technique for measuring dielectric tensors in anisotropic layered structures, such as thin
films of biaxial materials, is demonstrated. The ellipsometric data are collected in a quasi …
films of biaxial materials, is demonstrated. The ellipsometric data are collected in a quasi …
[引用][C] Dielectric tensor measurement from a single Mueller matrix image
NA BEAUDRY, Y ZHAO… - Journal of the Optical …, 2007 - pascal-francis.inist.fr
Dielectric tensor measurement from a single Mueller matrix image CNRS Inist Pascal-Francis
CNRS Pascal and Francis Bibliographic Databases Simple search Advanced search Search by …
CNRS Pascal and Francis Bibliographic Databases Simple search Advanced search Search by …
Dielectric tensor measurement from a single Mueller matrix image.
NA Beaudry, Y Zhao, R Chipman - Journal of the Optical Society of …, 2007 - europepmc.org
A technique for measuring dielectric tensors in anisotropic layered structures, such as thin
films of biaxial materials, is demonstrated. The ellipsometric data are collected in a quasi …
films of biaxial materials, is demonstrated. The ellipsometric data are collected in a quasi …
[PDF][PDF] Dielectric tensor measurement from a single Mueller matrix image
NA Beaudry, Y Zhao, R Chipman - scholar.archive.org
Ellipsometry is a well-established technique for determining optical properties such as
refractive indices, absorption coefficients, and film thicknesses of material samples by …
refractive indices, absorption coefficients, and film thicknesses of material samples by …
Dielectric tensor measurement from a single Mueller matrix image
NA Beaudry, Y Zhao… - Journal of the Optical …, 2007 - ui.adsabs.harvard.edu
A technique for measuring dielectric tensors in anisotropic layered structures, such as thin
films of biaxial materials, is demonstrated. The ellipsometric data are collected in a quasi …
films of biaxial materials, is demonstrated. The ellipsometric data are collected in a quasi …