JK Tyminski, T Matsuyama… - Optical …, 2009 - spiedigitallibrary.org
Optical imaging of IC critical designs is impacted by optical proximity effects, OPEs, originating from finite numerical aperture of projection lenses used in modern projectors …
JK Tyminski, T Matsuyama… - Optical …, 2007 - spiedigitallibrary.org
To meet the imaging resolution requirements, driven by the evolution of IC design rules, leading-edge scanners incorporate projection lenses with hyper-NAs. Moreover, immersion …
Of keen interest to the IC industry are advanced computational lithography applications such as Optical Proximity Correction of IC layouts (OPC), scanner matching by optical proximity …
Y Fan, L Zavyalova, Y Zhang, C Zhang… - Optical …, 2009 - spiedigitallibrary.org
A precise lithographic model has always been a critical component for the technique of Optical Proximity Correction (OPC) since it was introduced a decade ago [1]. As …
RA Ferguson, MA Lavin, LW Liebmann… - US Patent …, 2003 - Google Patents
2. Description of Related Art Integrated circuits are fabricated by lithographic techniques, where energy beams transmit integrated circuit images or patterns on photomasks to …
Q Zhang, P VanAdrichem… - Photomask and Next …, 2007 - spiedigitallibrary.org
An accurate process model has always been the key for successful implementation of model- based Optical Proximity Correction (OPC). As CD control requirements become severe at …
L Zavyalova, K Lucas, Q Zhang, Y Fan… - Optical …, 2008 - spiedigitallibrary.org
Production optical proximity correction (OPC) tools employ compact optical models in order to accurately predict complicated optical lithography systems with good theoretical accuracy …
N Voznesenskiy, HJ Stock, B Küchler… - Optical …, 2011 - spiedigitallibrary.org
A technique traditionally used for optical proximity correction (OPC) is extended to include topography proximity effects (TPE). Central to this is a thin-mask imaging model capable of …
MC Lam, K Adam - Optical Microlithography XX, 2007 - spiedigitallibrary.org
Some practical aspects of integrating a mask modeling solution into the Optical Proximity Correction (OPC) framework are discussed. Specifically, investigations were performed to …