Thermal-aware test scheduling for core-based SoC in an Abort-on-First-Fail test environment
Long test application time and high temperature have become two major issues of system-
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
Thermal-Aware Test Scheduling for Core-Based SoC in an Abort-on-First-Fail Test Environment
Z He, Z Peng, P Eles - 2009 12th Euromicro Conference on Digital …, 2009 - computer.org
Long test application time and high temperature have become two major issues of system-
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
[引用][C] Thermal-Aware Test Scheduling for Core-Based SoC in an Abort-on-First-Fail Test Environment
Z He, Z Peng, P Eles - Proceedings of the 2009 12th Euromicro …, 2009 - dl.acm.org
Thermal-Aware Test Scheduling for Core-Based SoC in an Abort-on-First-Fail Test Environment
| Proceedings of the 2009 12th Euromicro Conference on Digital System Design, Architectures …
| Proceedings of the 2009 12th Euromicro Conference on Digital System Design, Architectures …
[PDF][PDF] Thermal-Aware Test Scheduling for Core-based SoC in an Abort-on-First-Fail Test Environment
Z He, Z Peng, P Eles - researchgate.net
Long test application time and high temperature have become two major issues of system-
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
Thermal-Aware Test Scheduling for Core-based SoC in an Abort-on-First-Fail Test Environment
Z He, Z Peng, PI Eles - … Conference on Digital System Design (DSD) …, 2009 - diva-portal.org
Long test application time and high temperature have become two major issues of system-
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
[PDF][PDF] Thermal-Aware Test Scheduling for Core-based SoC in an Abort-on-First-Fail Test Environment
Z He, Z Peng, P Eles - ida.liu.se
Long test application time and high temperature have become two major issues of system-
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
Thermal-Aware Test Scheduling for Core-Based SoC in an Abort-on-First-Fail Test Environment
Z He, Z Peng, P Eles - 2009 12th Euromicro Conference on Digital System … - infona.pl
Long test application time and high temperature have become two major issues of system-
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
Thermal-Aware Test Scheduling for Core-based SoC in an Abort-on-First-Fail Test Environment
Z He, Z Peng, P Eles - ida.liu.se
Long test application time and high temperature have become two major issues of system-
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …
on-chip (SoC) test. In order to minimize test application times and avoid overheating during …