Abstract (EN) Near-field optical microscopy has attracted remarkable attention, as it is the
only technique that allows the investigation of local optical properties with a resolution far …

Over the last decade, scattering-type scanning near-field optical microscopy and
spectroscopy have been widely used in nano-photonics and material research due to their …

We present a quantitative quasi-analytical model to predict and analyze signals on layered
samples measured by infrared scattering-type scanning near-field optical microscopy. Our …

Using scattering-type near-field infrared microscopy in combination with a free-electron
laser, intersublevel transitions in buried single InAs quantum dots are investigated. The …

We report the results of near-field spectroscopy measurements performed using a scanning
near-field optical microscopy system combined with an infrared synchrotron radiation …

Apertureless scanning near-field optical microscopy is a valuable tool for characterization of
chemical and spectroscopic properties of the materials at the nanoscale. Description of …

Near-field optical microscopy allows the nondestructive examination of surfaces with a
spatial resolution far below the diffraction limit of Abbe. In fact, the resolution of this kind of …

Near-field microscopy overcomes the diffraction limit through the partial conversion of the
evanescent fields, formed around the subwavelength sources of light, into propagating …

Near‐field optical microscopes provide highly resolved images of various samples.
However, images are difficult to interpret owing to their sensitivity to illumination conditions …

The spatial resolution of optical spectroscopy is limited by the wavelength of the probing
light according to the diffraction limit. Several superresolution microscopic methods have …