The dual rotating-compensator Mueller matrix ellipsometer based on the optical
configuration PC1r (ω1) SC2r (ω2) A has been developed recently with many applications …

A dual rotating compensator ellipsometer based on the optical PC1SC2A configuration
described by Collins [1, chap. 7.3] has been developed. The systematic errors for this …

Due to the instability of motor speeds, asynchrony in trigger systems, and mechanical
factors, the use of continuous dual-rotating compensator (DRC)-Mueller matrix ellipsometer …

Since Mueller matrix ellipsometer (MME) has been used as a highly accurate tool for thin
film measurement, the error analysis and repeatability enhancement of such a tool are of …

A multichannel ellipsometer in the dual rotating-compensator configuration has been
designed and constructed for applications in real time Mueller matrix ellipsometry (approx. 2 …

Systematic methods for data reduction have been developed for the dual rotating-
compensator ellipsometer in the PC1r (ω1) SC2r (ω2) A configuration, where P, C1r (ω1), S …

To reduce the error induced by light source fluctuations, motor rotation instability,
environment, and other factors in real-time measurements using dual-rotating compensator …

We investigate the systematic errors at the second order for a Mueller matrix ellipsometer in
the dual rotating compensator configuration. Starting from a general formalism, we derive …

Dual-rotating compensator Mueller matrix ellipsometer (DRC-MME) has been designed and
applied as a powerful tool for the characterization of thin films and nanostructures. The …

We describe the design of a high-speed multichannel ellipsometer in the optical
configuration PC_1r (ω_1) SC_2r (ω_2) A having frequency-coupled rotating compensators …