Carrier time-of-flight measurement using a probe structure for direct evaluation of carrier transport in multiple quantum well solar cells

K Toprasertpong, N Kasamatsu, H Fujii… - IEEE Journal of …, 2014 - ieeexplore.ieee.org
Carrier transport across multiple quantum well (MQW) structures inserted in the i-region of a
pin diode is an important mechanism that determines the performance of MQW solar cells …
被引用次数：24 相关文章

Carrier Time-of-Flight Measurement Using a Probe Structure for Direct Evaluation of Carrier Transport in Multiple Quantum Well Solar Cells

K Toprasertpong, N Kasamatsu, H Fujii, T Kada… - IEEE Journal of …, 2014 - infona.pl
Carrier transport across multiple quantum well (MQW) structures inserted in the i-region of a
pin diode is an important mechanism that determines the performance of MQW solar cells …

[引用][C] Carrier Time-of-Flight Measurement Using a Probe Structure for Direct Evaluation of Carrier Transport in Multiple Quantum Well Solar Cells

K Toprasertpong, N Kasamatsu, H Fujii… - IEEE Journal of …, 2014 - cir.nii.ac.jp
Carrier Time-of-Flight Measurement Using a Probe Structure for Direct Evaluation of Carrier
Transport in Multiple Quantum Well Solar Cells | CiNii Research CiNii 国立情報学研究所 学術 …
[PDF] researchgate.net

[PDF][PDF] Carrier Time-of-Flight Measurement Using a Probe Structure for Direct Evaluation of Carrier Transport in Multiple Quantum Well Solar Cells

K Toprasertpong, N Kasamatsu, H Fujii, T Kada… - researchgate.net
(MQW) structures inserted in the i-region of a pin diode is an important mechanism that
determines the performance of MQW solar cells. We have employed a carrier time-of-flight …