As the supply voltage decreases, the sensitivity of the integrated circuits to radiation
increases dramatically, affecting various components such as memory cells. This paper …

The radiation sensitivity of integrated memory cells increases dramatically as the supply
voltage decreases. Although there are some Error Correcting Code (ECC) studies to prevent …

The number of memory faults operating in radiation environments increases with the
electronic device miniaturization. One-dimensional (1D) Error Correction Codes (ECCs) are …

The integrated circuit shrinkage increases the probability and the number of errors in
memories due to the increase in the sensitivity to electromagnetic radiation. Critical …

The evolution of microelectronics boosts more scalable and complex circuit designs,
providing high processing speed and greater storage capacity. However, reliability issues …

The paper presents an alternative Single-Event Effect (SEE)-tolerant Triple Modular
Redundancy (TMR) circuit topology for space applications. The proposed D-flip-flop circuit …

Soft error induced by space radiation particles can cause serious threat for memories that
are widely used in the electronic system of aerospace task. This can corrupt the stored data …

Memory used for storing the configuration bitstream of field programmable gate array in
space applications often encounters single event upset problems, which may disrupt the …

Space applications face severe challenges from soft errors caused by cosmic rays. Soft
errors can change the storage state of memories used in electronic system, leading to …

Fault tolerance is gaining more and more attention for the increasing need of reliability in
industrial, automotive and aerospace applications. This paper presents a survey of the fault …