[HTML][HTML] Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs
We study how nitridation, applied to SiON gate layers, impacts the reliability of planar metal-
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs
S Tyaginov, B O'Sullivan, A Chasin… - …, 2023 - pubmed.ncbi.nlm.nih.gov
We study how nitridation, applied to SiON gate layers, impacts the reliability of planar metal-
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs
S Tyaginov, B O'Sullivan, A Chasin, Y Rawal… - …, 2023 - search.proquest.com
We study how nitridation, applied to SiON gate layers, impacts the reliability of planar metal-
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
[HTML][HTML] Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs
S Tyaginov, B O'Sullivan, A Chasin, Y Rawal… - …, 2023 - ncbi.nlm.nih.gov
We study how nitridation, applied to SiON gate layers, impacts the reliability of planar metal-
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs.
S Tyaginov, B O'Sullivan, A Chasin, Y Rawal… - …, 2023 - search.ebscohost.com
We study how nitridation, applied to SiON gate layers, impacts the reliability of planar metal-
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs.
S Tyaginov, B O'Sullivan, A Chasin, Y Rawal… - Micromachines, 2023 - go.gale.com
We study how nitridation, applied to SiON gate layers, impacts the reliability of planar metal-
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs.
S Tyaginov, B O'Sullivan, A Chasin, Y Rawal… - …, 2023 - europepmc.org
We study how nitridation, applied to SiON gate layers, impacts the reliability of planar metal-
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
[PDF][PDF] Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs. Micromachines 2023, 14, 1514
S Tyaginov, B O'Sullivan, A Chasin, Y Rawal… - 2023 - lirias.kuleuven.be
We study how nitridation, applied to SiON gate layers, impacts the reliability of planar metal-
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs
Micromachines, 2023 - europepmc.org
We study how nitridation, applied to SiON gate layers, impacts the reliability of planar metal-
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …
oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive …