NS-GAAFET compact modeling: technological challenges in Sub-3-nm circuit performance

F Mo, CE Spano, Y Ardesi, M Ruo Roch, G Piccinini… - Electronics, 2023 - mdpi.com
NanoSheet-Gate-All-Around-FETs (NS-GAAFETs) are commonly recognized as the future
technology to push the digital node scaling into the sub-3 nm range. NS-GAAFETs are …

Nanosheet-GAAFETs modeling and circuit performance evaluation

M Amato - 2021 - webthesis.biblio.polito.it
During the last decade, three-dimensional electronic devices, known as Fin field-effect
transistors (FinFETs), have been developed to pursue continuous technology scaling, by …

11 Challenges and future scope of gate-all-around (GAA) transistors

S Srivastava, A Acharya - Device Circuit Co-Design Issues in …, 2023 - books.google.com
No doubt, FinFET technology is the slogger of today's semiconductor world. But as demand
for further scaling with a desire for ultra-low-power and high-speed applications results in …

Challenges and future scope of gate-all-around (GAA) transistors: Physical insights of device-circuit interactions

S Srivastava, A Acharya - Device Circuit Co-Design Issues in FETs, 2024 - taylorfrancis.com
Undoubtedly, FinFET technology is the slogger of today's semiconductor world. However,
the demand for further scaling with a desire for ultra-low-power and high-speed applications …

Gate-All-Around FETs: nanowire and nanosheet structure

JS Yoon, J Jeong, S Lee, J Lee… - Nanowires-recent …, 2021 - books.google.com
DC/AC performances of 3-nm-node gate-all-around (GAA) FETs having different widths and
the number of channels (Nch) from 1 to 5 were investigated thoroughly using fully-calibrated …

Impact of high‐κ gate dielectric and other physical parameters on the electrostatics and threshold voltage of long channel gate‐all‐around nanowire transistor

SUZ Khan, MS Hossain, FU Rahman… - … Journal of Numerical …, 2015 - Wiley Online Library
High‐κ gate‐all‐around structure counters the Short Channel Effect (SCEs) mostly providing
excellent off‐state performance, whereas high mobility III–V channel ensures better on‐state …

From FinFET to Nanosheet Si-SiGe GAAFET: fabrication process simulation and analysis

M Pelosi - 2021 - webthesis.biblio.polito.it
The field-effect transistors are one of the building blocks of modern electronics. In the last 50
years, transistor technology had a noticeable development. According to Moore's law, the …

Parasitic capacitance model for stacked gate-all-around nanosheet FETs

S Sharma, S Sahay, R Dey - IEEE Transactions on Electron …, 2023 - ieeexplore.ieee.org
Gate-all-around (GAA) nanosheet field-effect transistors (NSFETs) are hailed as the most
promising architecture for the incessant scaling of MOSFETs to the sub-5-nm technology …

Investigation of electrically gate-all-around hexagonal nanowire FET (HexFET) architecture for 5 nm node logic and SRAM applications

JA Smith, K Ni, RK Ghosh, J Xu… - 2017 47th European …, 2017 - ieeexplore.ieee.org
This work investigates, in detail, the electrically gate-all-around (eGAA) Hexagonal NW FET
(HexFET) which combines the high current drive of FinFETs with the excellent electrostatic …

Optimization and benchmarking FinFETs and GAA nanosheet architectures at 3-nm technology node: Impact of unique boosters

KK Bhuwalka, H Wu, W Zhao, G Rzepa… - … on Electron Devices, 2022 - ieeexplore.ieee.org
Using a full design-technology cooptimization (DTCO) framework, we benchmark gate-all-
around (GAA) nanosheet (NS) FETs against FinFETs at 3-nm logic technology relevant …