[PDF][PDF] 基于单光弹调制器的米勒矩阵测量误差分析

曹绍谦, 步扬, 王向朝, 李思坤, 汤飞龙, 李中梁 - Acta Optica Sinica, 2013 - researching.cn
摘要针对已有单光弹调制器米勒矩阵测量技术缺乏定量误差分析的不足, 提出了单光弹调制器米
勒矩阵测量误差方程, 给出了相对误差分析方法, 并结合矩阵条件数得到了降低米勒矩阵各元素 …

Scattered light measurements on textured crystalline silicon substrates using an angle-resolved Mueller matrix polarimeter

M Foldyna, M Moreno, PR i Cabarrocas… - Applied optics, 2010 - opg.optica.org
Dry plasma etching is a promising technique for crystalline silicon surface texturing aimed at
improving solar cell efficiencies by reducing incident light reflection and backscattering at …

Parameterizing liquid crystal variable retarder structural organization with a fractal-Born approximation model

JC Gladish, DD Duncan - Optical Engineering, 2016 - spiedigitallibrary.org
Liquid crystal variable retarders (LCVRs) are computer-controlled birefringent devices that
contain nanometer-sized birefringent liquid crystals (LCs). These devices impart retardance …

In and out of incidence plane Mueller matrix scattering ellipsometry of rough mc-Si

J Maria, LMS Aas, M Kildemo - Thin solid films, 2014 - Elsevier
A partial in and out of incidence plane Mueller matrix scattering ellipsometry (MMSE)
experiment is presented, where the Stokes vectors of the scattered light are detected in …

Nondestructive analysis of coated periodic nanostructures from optical data

TH Ghong, SH Han, JM Chung, JS Byun, TJ Kim… - Optics letters, 2010 - opg.optica.org
Optical data are essential for the accurate nondestructive determination of profiles of
periodic structures in integrated-circuit technology. In rigorous coupled-wave analysis, the …

Liquid crystal-based spectral imaging goniometric polarimeter for sample characterization

JC Gladish, DD Duncan - Dynamics and Fluctuations in …, 2014 - spiedigitallibrary.org
The ability to measure polarization effects is important in many biological and industrial
applications. Additionally, measuring spectral and scatter effects can offer greater sensitivity …

Optical Scale Polarimetric Device for Nanotube Forest Measurement: An Opportunity to Anticipate Bistatic Polarimetric SAR Images of Tree Trunk Forests at P-Band

E Everaere, É Colin-Koeniguer… - IEEE Journal of …, 2016 - ieeexplore.ieee.org
This paper investigates a new polarimetric device that produces reduced scale
measurements for bistatic radar. The optical scale device is proposed to overcome the lack …

Silicon Nanowires for Photovoltaics: from the Material to the Device

A Togonal - 2016 - pastel.hal.science
Silicon Nanowire (SiNW) based solar cells offer an interesting choice towards low-cost and
highly efficient solar cells. Indeed solar cells based on SiNWs benefit from their outstanding …

Mueller Matrix Imaging and Spectroscopy

LMS Aas - 2013 - ntnuopen.ntnu.no
This thesis presents experimental work on the following topics in Mueller matrix polarimetry;
instrument design and implementation, and selected applications of liquid crystal based …

Profile characterization of diffraction gratings using angle-resolved polarimetric measurements

M Foldyna, A De Martino, C Licitra… - EPJ Web of …, 2010 - epj-conferences.org
Development of the characterization tools and techniques used by semi-conductor industry
directs not only towards increasing of the instrumental precision, to push limits of the optical …