[HTML][HTML] Investigation of the milling characteristics of different focused-ion-beam sources assessed by three-dimensional electron diffraction from crystal lamellae
Three-dimensional electron diffraction (3DED) from nanocrystals of biological
macromolecules requires the use of very small crystals. These are typically less than 300 nm …
macromolecules requires the use of very small crystals. These are typically less than 300 nm …
[HTML][HTML] Application of advanced (S) TEM methods for the study of nanostructured porous functional surfaces: A few working examples
Nanostructured films offer the ability of modifying surface properties, even more, when they
can generate layers with controlled porosity. The lower implicit integrity of these (multi) …
can generate layers with controlled porosity. The lower implicit integrity of these (multi) …
Optical emission from focused ion beam milled halide perovskite device cross‐sections
Cross‐sectional transmission electron microscopy has been widely used to investigate
organic–inorganic hybrid halide perovskite‐based optoelectronic devices. Electron …
organic–inorganic hybrid halide perovskite‐based optoelectronic devices. Electron …
Optomechanical Properties of MoSe2 Nanosheets as Revealed by In Situ Transmission Electron Microscopy
Free-standing few-layered MoSe2 nanosheet stacks optoelectronic signatures are analyzed
by using light compatible in situ transmission electron microscopy (TEM) utilizing an optical …
by using light compatible in situ transmission electron microscopy (TEM) utilizing an optical …
[HTML][HTML] On the slip burst amplitude cutoff in dislocation-rich microcrystals
L Borasi, A Mortensen - Acta Materialia, 2024 - Elsevier
The plastic deformation of small-scale face-centered cubic metals exhibits intermittent slip
burst events that appear on stress-strain curves as sudden strain jumps and/or load drops …
burst events that appear on stress-strain curves as sudden strain jumps and/or load drops …
[HTML][HTML] Unveiling surfaces for advanced materials characterisation with large-area electrochemical jet machining
Surface preparation for advanced materials inspection methods like electron backscatter
diffraction (EBSD) generally involve laborious and destructive material sectioning and …
diffraction (EBSD) generally involve laborious and destructive material sectioning and …
Influence of Ga+ milling on the spin waves modes in a Co2MnSi Heusler magnonic crystal
S Mantion, N Biziere - Journal of Applied Physics, 2022 - pubs.aip.org
Ferromagnetic resonance experiment was performed to study the magnonic modes of an
antidot lattice nanopatterned in a sputtered Co2MnSi Heusler alloy thin film. The magnonic …
antidot lattice nanopatterned in a sputtered Co2MnSi Heusler alloy thin film. The magnonic …
A reliable workflow for improving nanoscale X-ray fluorescence tomographic analysis on nanoparticle-treated HeLa cells
Y Luo, T Paunesku, O Antipova, Y Liu, NJ Zaluzec… - Metallomics, 2022 - academic.oup.com
Scanning X-ray fluorescence (XRF) tomography provides powerful characterization
capabilities in evaluating elemental distribution and differentiating their inter-and intra …
capabilities in evaluating elemental distribution and differentiating their inter-and intra …
[HTML][HTML] Mechanical and compositional implications of gallium ion milling on epoxy resin
Focused Ion Beam (FIB) is one of the most common methods for nanodevice fabrication.
However, its implications on mechanical properties of polymers have only been speculated …
However, its implications on mechanical properties of polymers have only been speculated …
Atomic layer deposited Al2O3 as a protective overlayer for focused ion beam preparation of plan-view STEM samples
Preservation of analyte integrity during focused ion beam (FIB) sample preparation is a
significant challenge in the scanning transmission electron microscopy (STEM) …
significant challenge in the scanning transmission electron microscopy (STEM) …