Oxides, oxides, and more oxides: high-κ oxides, ferroelectrics, ferromagnetics, and multiferroics

N Izyumskaya, Y Alivov, H Morkoç - Critical Reviews in Solid State …, 2009 - Taylor & Francis
We review and critique the recent developments on multifunctional oxide materials, which
are gaining a good deal of interest. Recongnizing that this is a vast area, the focus of this …

XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures

MF Sunding, K Hadidi, S Diplas, OM Løvvik… - Journal of Electron …, 2011 - Elsevier
A technique is described for deposition of gold nanoparticles under vacuum, enabling
consistent energy referencing of X-ray photoelectron spectra obtained from lanthanum …

High-κ dielectrics and advanced channel concepts for Si MOSFET

M Wu, YI Alivov, H Morkoç - Journal of Materials Science: Materials in …, 2008 - Springer
With scaling of the gate length downward to increase speed and density, the gate dielectric
thickness must also be reduced. However, this practice which has been in effect for many …

Cerium dioxide buffer layers at low temperature by atomic layer deposition

J Päiväsaari, M Putkonen, L Niinistö - Journal of Materials Chemistry, 2002 - pubs.rsc.org
Thin films of cerium dioxide were deposited by atomic layer deposition (ALD). Temperature
ranges studied in detail were 175–375° C and 225–350° C for the Ce (thd) 4 and Ce (thd) …

Sm2O3 gate dielectric on Si substrate

WC Chin, KY Cheong, Z Hassan - Materials science in semiconductor …, 2010 - Elsevier
High dielectric constant (κ) materials have become a necessity for down scaling of metal-
oxide-semiconductor (MOS) based devices. Rare-earth oxides have been studied as …

Gradual reset and set characteristics in yttrium oxide based resistive random access memory

S Petzold, E Piros, SU Sharath, A Zintler… - Semiconductor …, 2019 - iopscience.iop.org
This paper addresses the resistive switching behavior in yttrium oxide based resistive
random access memory (RRAM)(TiN/yttrium oxide/Pt) devices. We report the coexistence of …

Ce(IV) Complexes with Donor-Functionalized Alkoxide Ligands: Improved Precursors for Chemical Vapor Deposition of CeO2

HC Aspinall, J Bacsa, AC Jones, JS Wrench… - Inorganic …, 2011 - ACS Publications
Thin films of ceria (CeO2) have many applications, and their synthesis by liquid-injection
MOCVD (metal–organic chemical vapor deposition) or ALD (atomic layer deposition) …

Recent developments in rapid thermal processing

AT Fiory - Journal of electronic materials, 2002 - Springer
Rapid thermal annealing (RTA) with a short dwell time at maximum temperature is used with
ion implantation to form shallow junctions and polycrystalline-Si gate electrodes in …

Surface transmission electron diffraction for SrTiO 3 surfaces

DM Kienzle, LD Marks - CrystEngComm, 2012 - pubs.rsc.org
This work highlights transmission electron diffraction (TED) for determining surface
structures and understanding the model perovskite system, SrTiO3, which has been …

Atomic Layer Deposition of CeO2 Film with a Novel Heteroleptic Ce(III) Complex

W Zhao, H Zhou, J Li, Y Lu, Y Ding - Molecules, 2024 - mdpi.com
In this paper, four heteroleptic Ce (III) complexes, including Ce (thd) 3-phen (thd= 2, 2, 6, 6-
tetramethyl-3, 5-heptanedione, phen= 1, 10—phenanthroline (1), Ce (thd) 3-MEDA (MEDA …