M Duwe, JH Quast, S Schneider, D Fischer… - Journal of Vacuum …, 2019 - pubs.aip.org
For the vast majority of ellipsometric measurements, the application of planar substrates is mandatory and requires a proper sample alignment prior to the measurement. Here, the …
I Ohlídal, J Vohánka, M Čermák, D Franta - Optical Characterization of …, 2018 - Springer
In this chapter the theoretical aspects of ellipsometry and their applications in optics of layered systems are presented. The basic formulae of the theory of ellipsometric …
XS Yao, L Yan, Y Shi - Optics letters, 2005 - opg.optica.org
We report an all solid-state polarization-state generator that uses magneto-optic polarization rotators. The device can generate either five or six distinctive polarization states uniformly …
While several analyses of polarimeter noise-reduction have been published, little data has been presented to support the analytical results, particularly for a laser polarimeter based on …
Y Liang, Z Qu, Y Zhong, Z Song, S Li - Applied optics, 2019 - opg.optica.org
Modulation using a rotating waveplate is the most popular way in astronomy to obtain radiation polarization states and thus the physical condition of celestial bodies. Modulation …
L Giudicotti, M Brombin - Applied optics, 2007 - opg.optica.org
Data analysis techniques are reviewed and extended for the measurement of the Stokes vector of partially or completely polarized radiation by the rotating quarter-wave method. It is …
X Chen, S Liu, H Gu, C Zhang - Thin Solid Films, 2014 - Elsevier
Recently, the Mueller matrix polarimeter (MMP) has been introduced for critical dimension and overlay metrology. In practice, the measurement process invariably has errors. These …