Infrared optical responses of wurtzite InxGa1− xN thin films with porous surface morphology

P Yew, SC Lee, SS Ng, HA Hassan, WL Chen… - Thin Solid Films, 2016 - Elsevier
Room temperature infrared (IR) optical responses of wurtzite indium gallium nitride (In x Ga
1− x N) in the composition range of 0.174≤ x≤ 0.883 were investigated by the polarized IR …

Raman and photoluminescence mapping of InxGa1− xN (x∼ 0.4) at high pressure: optical determination of composition and stress

V Gkrana, K Filintoglou, J Arvanitidis… - Applied Physics …, 2014 - pubs.aip.org
The pressure response of a polar wurtzite In x Ga 1− x N (x= 0.37) film epitaxially grown on a
GaN/sapphire template was studied by means of combined Raman and photoluminescence …

INVESTIGATING STRUCTURAL AND OPTICAL CHARACTERISTICS OF III-NITRIDE SEMICONDUCTOR MATERIALS

Y Liang, X Jiang, DN Talwar, L Wan, G Xu… - III-Nitride Materials …, 2017 - World Scientific
A comprehensive review is presented by using multiple spectroscopic methods on binary,
ternary and quaternary group III-nitride (GaN, AlN, InN, InGaN and InAlGaN) materials to …

Raman‐scattering probe of anharmonic effects due to temperature and composition in InGaN

JF Kong, WZ Shen, QX Guo - physica status solidi (b), 2013 - Wiley Online Library
We have carried out a detailed investigation of temperature‐dependent micro‐Raman
scattering on In1− xGaxN films with different Ga compositions (0.06≤ χ≤ 0.91). The …

RF-MBE and MOVPE InxGa1-xN films over the entire composition range: A study on growth method dependence

AG Bhuiyan, MS Islam, D Hironaga… - Superlattices and …, 2020 - Elsevier
This paper reports the influence of different growth methods on the In x Ga 1-x N ternary
alloys over the entire composition range. We have successfully fabricated the single …

[PDF][PDF] Gucmann, F.,... Kuzmík, J.(2019). Evidence of relationship between strain and In-incorporation: Growth of N-polar In-rich InAlN buffer layer by OMCVD. Journal …

P Chauhan, S Hasenöhrl, E Dobroka, MP Chauvat… - academia.edu
ABSTRACT Two In𝑥Al1− 𝑥N layers were grown simultaneously on different substrates
(sapphire (0001) and Ga-polar GaN template) but under the same reactor conditions were …

[图书][B] Growth and characterization of InN and In-rich InGaN alloys by migration-enhanced plasma-assisted MOCVD

D Seidlitz - 2019 - search.proquest.com
This thesis investigates and presents the structural and optoelectronic properties of indium
nitride (InN) and indium gallium nitride (InGaN) alloys. Furthermore, this work describes the …

High-pressure Raman scattering in InGaN heteroepitaxial layers: Effect of the substrate on the phonon pressure coefficients

R Oliva, J Ibáñez, R Cuscó, A Dadgar, A Krost… - Applied Physics …, 2014 - pubs.aip.org
We perform high-pressure Raman-scattering measurements on different In x Ga 1-x N/Si
(111) epilayers (0.19< x< 0.45). We find that the experimental pressure coefficient of the A 1 …

Local heat energy transport analyses in gallium-indium-nitride/gallium nitride Heterostructure by microscopic Raman imaging exploiting simultaneous irradiation of …

S Okamoto, N Saito, K Ito, B Ma… - International …, 2020 - asmedigitalcollection.asme.org
Local heat transport in two GaxIn1-xN/GaN-heterostructures on sapphire substrates is
investigated by microscopic Raman imaging using two lasers of 532 nm (Raman …

Temperature Dependence of Surface Acoustic Wave Propagation Velocity in InxGa1-xN Films Obtained by High-Resolution Brillouin Spectroscopy: Determination of …

RJJ Riobóo, C Prieto, R Cusco, L Artús… - Applied Physics …, 2013 - iopscience.iop.org
Temperature-dependent surface acoustic wave (SAW) propagation velocity and temperature
coefficient of frequency (TCF) have been determined for the first time in In x Ga 1-x N alloys …