An introduction to the compute express link (cxl) interconnect

DD Sharma, R Blankenship, DS Berger - arXiv preprint arXiv:2306.11227, 2023 - arxiv.org
The Compute Express Link (CXL) is an open industry-standard interconnect between
processors and devices such as accelerators, memory buffers, smart network interfaces …

PARBOR: An efficient system-level technique to detect data-dependent failures in DRAM

S Khan, D Lee, O Mutlu - 2016 46th Annual IEEE/IFIP …, 2016 - ieeexplore.ieee.org
System-level detection and mitigation of DRAM failures offer a variety of system
enhancements, such as better reliability, scalability, energy, and performance. Unfortunately …

DRAM bender: An extensible and versatile FPGA-based infrastructure to easily test state-of-the-art DRAM chips

A Olgun, H Hassan, AG Yağlıkçı… - … on Computer-Aided …, 2023 - ieeexplore.ieee.org
To understand and improve DRAM performance, reliability, security, and energy efficiency,
prior works study characteristics of commodity DRAM chips. Unfortunately, state-of-the-art …

Demystifying complex workload-DRAM interactions: An experimental study

S Ghose, T Li, N Hajinazar, DS Cali… - Proceedings of the ACM on …, 2019 - dl.acm.org
It has become increasingly difficult to understand the complex interactions between modern
applications and main memory, composed of Dynamic Random Access Memory (DRAM) …

In-DRAM bulk bitwise execution engine

V Seshadri, O Mutlu - arXiv preprint arXiv:1905.09822, 2019 - arxiv.org
Many applications heavily use bitwise operations on large bitvectors as part of their
computation. In existing systems, performing such bulk bitwise operations requires the …

Bit-exact ECC recovery (BEER): Determining DRAM on-die ECC functions by exploiting DRAM data retention characteristics

M Patel, JS Kim, T Shahroodi… - 2020 53rd Annual …, 2020 - ieeexplore.ieee.org
Increasing single-cell DRAM error rates have pushed DRAM manufacturers to adopt on-die
error-correction coding (ECC), which operates entirely within a DRAM chip to improve …

Detecting and mitigating data-dependent DRAM failures by exploiting current memory content

S Khan, C Wilkerson, Z Wang, AR Alameldeen… - Proceedings of the 50th …, 2017 - dl.acm.org
DRAM cells in close proximity can fail depending on the data content in neighboring cells.
These failures are called data-dependent failures. Detecting and mitigating these failures …

Crow: A low-cost substrate for improving dram performance, energy efficiency, and reliability

H Hassan, M Patel, JS Kim, AG Yaglikci… - Proceedings of the 46th …, 2019 - dl.acm.org
DRAM has been the dominant technology for architecting main memory for decades. Recent
trends in multi-core system design and large-dataset applications have amplified the role of …

An experimental analysis of RowHammer in HBM2 DRAM chips

A Olgun, M Osseiran, AG Yağlıkçı… - 2023 53rd Annual …, 2023 - ieeexplore.ieee.org
RowHammer (RH) is a significant and worsening security, safety, and reliability issue of
modern DRAM chips that can be exploited to break memory isolation. Therefore, it is …

DASH: Deadline-aware high-performance memory scheduler for heterogeneous systems with hardware accelerators

H Usui, L Subramanian, KKW Chang… - ACM Transactions on …, 2016 - dl.acm.org
Modern SoCs integrate multiple CPU cores and hardware accelerators (HWAs) that share
the same main memory system, causing interference among memory requests from different …