S Khan, D Lee, O Mutlu - 2016 46th Annual IEEE/IFIP …, 2016 - ieeexplore.ieee.org
System-level detection and mitigation of DRAM failures offer a variety of system enhancements, such as better reliability, scalability, energy, and performance. Unfortunately …
To understand and improve DRAM performance, reliability, security, and energy efficiency, prior works study characteristics of commodity DRAM chips. Unfortunately, state-of-the-art …
It has become increasingly difficult to understand the complex interactions between modern applications and main memory, composed of Dynamic Random Access Memory (DRAM) …
V Seshadri, O Mutlu - arXiv preprint arXiv:1905.09822, 2019 - arxiv.org
Many applications heavily use bitwise operations on large bitvectors as part of their computation. In existing systems, performing such bulk bitwise operations requires the …
Increasing single-cell DRAM error rates have pushed DRAM manufacturers to adopt on-die error-correction coding (ECC), which operates entirely within a DRAM chip to improve …
DRAM cells in close proximity can fail depending on the data content in neighboring cells. These failures are called data-dependent failures. Detecting and mitigating these failures …
DRAM has been the dominant technology for architecting main memory for decades. Recent trends in multi-core system design and large-dataset applications have amplified the role of …
RowHammer (RH) is a significant and worsening security, safety, and reliability issue of modern DRAM chips that can be exploited to break memory isolation. Therefore, it is …
Modern SoCs integrate multiple CPU cores and hardware accelerators (HWAs) that share the same main memory system, causing interference among memory requests from different …