Medidas de resistividade elétrica DC em sólidos: como efetuálas corretamente

EM Girotto, IA Santos - Química Nova, 2002 - SciELO Brasil
This paper deals with the most common methods for determining the dc electrical resistivity
in solid materials. A brief overview of the fundamental concepts related to the electrical …

Photochromic gratings in photorefractive materials

RB Bylsma, DH Olson, AM Glass - Optics letters, 1988 - opg.optica.org
The steady-state and dynamic behavior of absorption and phase gratings in semi-insulating
GaAs and InP have been studied by four-wave mixing. These measurements permit …

Automated polarimeter–macroscope for optical mapping of birefringence, azimuths, and transmission in large area wafers. Part I. Theory of the measurement

AL Bajor - Review of scientific instruments, 1995 - pubs.aip.org
A computer‐controlled polarimeter–macroscope has been developed to measure
birefringence (phase retardation), the principal azimuths and transmission in large area (up …

Photorefractive two-wave mixing in semiconductors of the 4¯3m space group in general spatial orientation

HJ Eichler, Y Ding, B Smandek - Physical Review A, 1995 - APS
The photorefractive two-wave mixing gain coefficient Γ of GaAs: Cr and InP: Fe, cut with
different crystallographic orientations, was determined using a cw Nd: YAG (neodymium …

Photorefractive characterization of deep level compensation in semi‐insulating GaAs

A Partovi, EM Garmire, GC Valley, MB Klein - Applied physics letters, 1989 - pubs.aip.org
We show that photorefractive beam coupling can be used for deep level spectroscopy in
semi‐insulating GaAs. In four samples cut from different locations in a single boule of GaAs …

Deep level photorefractive spectroscopy of semiconductors

DD Nolte, DH Olson, AM GLASS - Quantum Electronics and Laser …, 1989 - opg.optica.org
Defect energy levels within the band gaps of semiconductor crystals can strongly influence
electronic and optical properties. While many techniques exist that can characterize and …

DC electrical resistivity measurements in solids: how to proceed correctly

EM Girotto, IA Santos - Química Nova, 2002 - SciELO Brasil
This paper deals with the most common methods for determining the dc electrical resistivity
in solid materials. A brief overview of the fundamental concepts related to the electrical …

[PDF][PDF] Photorefractive materials and devices

M Cronin-Golomb, M Klein - Handbook of Optics, 1995 - ndl.ethernet.edu.et
Photorefractive materials have been used in a wide variety of applications, as will be
discussed later. These materials have several features which make them particularly …

三电极法电阻率二维分布测量技术及其应用

孙毅之, 施亚申, 赵瑞瑶, 李光平, 苑进良 - 现代仪器使用与维修, 1998 - cqvip.com
三电极法电阻率二维分布测量技术及其应用-[维普官方网站]-www.cqvip.com-维普网  我的维普
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Photodiffractive Characterization of Growth-Defects in GaAs

K Jarasiunas, M Sudzius, A Kaniava… - MRS Online Proceedings …, 1995 - cambridge.org
The transient grating technique has been developed over the years and several reviews
have been written concerning the subject [1, 2]. The present paper will focus on its …