Chemical mechanical planarization for microelectronics applications

PB Zantye, A Kumar, AK Sikder - Materials Science and Engineering: R …, 2004 - Elsevier
The progressively decreasing feature size of the circuit components has tremendously
increased the need for the global surface planarization of the various thin film layers that …

Dielectric barrier, etch stop, and metal capping materials for state of the art and beyond metal interconnects

SW King - ECS Journal of Solid State Science and Technology, 2014 - iopscience.iop.org
Over the past decade, the primary focus for improving the performance of nano-electronic
metal interconnect structures has been to reduce the impact of resistance-capacitance (RC) …

Precursors and chemistry for the atomic layer deposition of metallic first row transition metal films

TJ Knisley, LC Kalutarage, CH Winter - Coordination Chemistry Reviews, 2013 - Elsevier
Recent trends in the microelectronics industry are requiring the growth of metallic first row
transition metal films by the atomic layer deposition (ALD) method. The ALD growth of noble …

The Wet‐Oxidation of a Cu (111) Foil Coated by Single Crystal Graphene

D Luo, X Wang, BW Li, C Zhu, M Huang… - Advanced …, 2021 - Wiley Online Library
The wet‐oxidation of a single crystal Cu (111) foil is studied by growing single crystal
graphene islands on it followed by soaking it in water. 18O‐labeled water is also used; the …

Impact of VUV photons on SiO2 and organosilicate low-k dielectrics: General behavior, practical applications, and atomic models

MR Baklanov, V Jousseaume, TV Rakhimova… - Applied Physics …, 2019 - pubs.aip.org
This paper presents an in-depth overview of the application and impact of UV/VUV light in
advanced interconnect technology. UV light application in BEOL historically was mainly …

Low-temperature atomic layer deposition of copper films using borane dimethylamine as the reducing co-reagent

LC Kalutarage, SB Clendenning… - Chemistry of …, 2014 - ACS Publications
The atomic layer deposition (ALD) of Cu metal films was carried out by a two-step process
with Cu (OCHMeCH2NMe2) 2 and BH3 (NHMe2) on Ru substrates and by a three-step …

Volatility and high thermal stability in mid-to late-first-row transition-metal diazadienyl complexes

TJ Knisley, MJ Saly, MJ Heeg, JL Roberts… - …, 2011 - ACS Publications
Treatment of MCl2 (M= Cr, Mn, Fe, Co, Ni) with 2 equiv of lithium metal and 1, 4-di-tert-butyl-
1, 3-diazadiene (tBu2DAD) in tetrahydrofuran at ambient temperature afforded Cr …

Fabrication of high-quality single-crystal Cu thin films using radio-frequency sputtering

S Lee, JY Kim, TW Lee, WK Kim, BS Kim, JH Park… - Scientific reports, 2014 - nature.com
Copper (Cu) thin films have been widely used as electrodes and interconnection wires in
integrated electronic circuits and more recently as substrates for the synthesis of graphene …

[PDF][PDF] Cu thin films deposited by DC magnetron sputtering for contact surfaces on electronic components

K Mech, R Kowalik, P Żabiński - Archives of Metallurgy and …, 2011 - bibliotekanauki.pl
The results of the DC magnetron sputtering of copper thin films with different parameters of
deposition are presented. The main aim of studies was to determine the influence of current …

[HTML][HTML] Interface and layer periodicity effects on the thermal conductivity of copper-based nanomultilayers with tungsten, tantalum, and tantalum nitride diffusion …

C Cancellieri, EA Scott, J Braun, SW King… - Journal of Applied …, 2020 - pubs.aip.org
Nanomultilayers are complex architectures of materials stacked in sequence with layer
thicknesses in the nanometer range. Their application in microelectronics is challenged by …