Advances in AFM for the electrical characterization of semiconductors
RA Oliver - Reports on Progress in Physics, 2008 - iopscience.iop.org
Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …
principal application in the determination of surface topography. However, the use of the …
Electrical scanning probe microscopy: Investigating the inner workings of electronic and optoelectronic devices
SB Kuntze, D Ban, EH Sargent… - Critical Reviews in …, 2005 - Taylor & Francis
Semiconductor electronic and optoelectronic devices such as transistors, lasers, modulators,
and detectors are critical to the contemporary computing and communications infrastructure …
and detectors are critical to the contemporary computing and communications infrastructure …
[HTML][HTML] Direct nanoscale imaging of evolving electric field domains in quantum structures
The external performance of quantum optoelectronic devices is governed by the spatial
profiles of electrons and potentials within the active regions of these devices. For example …
profiles of electrons and potentials within the active regions of these devices. For example …
Microscopic Basis for the Mechanism of Carrier Dynamics in an Operating Junction Examined by Using Light-Modulated Scanning Tunneling Spectroscopy
S Yoshida, Y Kanitani, R Oshima, Y Okada… - Physical review …, 2007 - APS
The doping characteristics and carrier transport in a GaAs pn junction were visualized with
a∼ 10 nm spatial resolution, using light-modulated scanning tunneling spectroscopy. The …
a∼ 10 nm spatial resolution, using light-modulated scanning tunneling spectroscopy. The …
Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
Cross-sectional scanning tunneling microscopy is applied to semiconductor lasers which
are biased and producing light. Two device structures are investigated—a double quantum …
are biased and producing light. Two device structures are investigated—a double quantum …
SDVSRM-a new SSRM based technique featuring dynamically adjusted, scanner synchronized sample voltages for measurement of actively operated devices
S Doering, A Wachowiak, H Roetz, S Eckl, T Mikolajick - Ultramicroscopy, 2018 - Elsevier
Scanning spreading resistance microscopy (SSRM) with its high spatial resolution and high
dynamic signal range is a powerful tool for two-dimensional characterization of …
dynamic signal range is a powerful tool for two-dimensional characterization of …
Nanometer Probing of Operating Nano-Photonic Devices
RS Dhar - 2014 - uwspace.uwaterloo.ca
The external performance of quantum optoelectronic devices is governed by the three-
dimensional profiles of electric potentials determined by the distribution of charge carriers …
dimensional profiles of electric potentials determined by the distribution of charge carriers …
Probing the Inner Workings of Quantum Photonic Devices
D Ban - Optoelectronic Devices and Integration, 2019 - opg.optica.org
Scanning probe microscopy, including scanning spreading resistance microscopy, scanning
capacitance microscopy and scanning voltage microscopy (SVM), is a novel and enabling …
capacitance microscopy and scanning voltage microscopy (SVM), is a novel and enabling …
Direct observation of electron overbarrier leakage in actively driven buried heterostructure multi-quantum-well lasers
D Ban, EH Sargent - Photonics North 2004: Optical …, 2004 - spiedigitallibrary.org
We have developed a new scanning probe microscopy-based technique, scanning
differential spreading resistance microscopy (SDSRM) and applied it to profile the free …
differential spreading resistance microscopy (SDSRM) and applied it to profile the free …
On the ideality factor of the GaAlAs semiconductor diode below knee voltage
SB Ota, S Ota - Modern Physics Letters B, 2007 - World Scientific
ON THE IDEALITY FACTOR OF THE GaAlAs SEMICONDUCTOR DIODE BELOW KNEE
VOLTAGE Page 1 Final Reading August 15, 2007 10:29 WSPC/147-MPLB 01360 Modern …
VOLTAGE Page 1 Final Reading August 15, 2007 10:29 WSPC/147-MPLB 01360 Modern …