VLSI implementation of low power scan based testing
S Ukey, S Rathkanthiwar… - … on Communication and …, 2016 - ieeexplore.ieee.org
Power consumption in test becomes a higher barrier for consideration in test of any
combinational circuit is high during test mode as in its normal mode of functioning as …
combinational circuit is high during test mode as in its normal mode of functioning as …
[PDF][PDF] Multiple Scan Base Partitioning Technique to Increase the Throughput in VLSI Testing
P Ramalakshmi, S Saravanan - Indian Journal …, 2016 - sciresol.s3.us-east-2.amazonaws …
Among any testing methods, scan testing is very significant for both in built and external
schemes. The performance of the system should get maintained so the throughput plays …
schemes. The performance of the system should get maintained so the throughput plays …