Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …

For the first time local electrical characteristics of a blend of two semiconducting polymers
were studied with conductive atomic force microscopy (C-AFM). The investigated mixture is …

We report multiwavelength single InGaAs/InP quantum well nanowire light-emitting diodes
grown by metal organic chemical vapor deposition using selective area epitaxy technique …

Semiconductor electronic and optoelectronic devices such as transistors, lasers, modulators,
and detectors are critical to the contemporary computing and communications infrastructure …

We experimentally investigated the effect of oscillator strength (radiative transition
diagonality) on the performance of resonant phonon-based terahertz quantum cascade …

A silicon pn junction has been mapped using electron beam induced current in both a
scanning transmission electron microscope (STEM) and a conventional scanning electron …

The external performance of quantum optoelectronic devices is governed by the spatial
profiles of electrons and potentials within the active regions of these devices. For example …

Comparison of equivalent circuit models (ECM) for photoconductive antennas (PCA)
represents a challenge due to the multiphysics phenomena involved during PCA operation …

We present a new charge trapping memory (CTM) device with the Au/Ga 2 O 3/SiO 2/Si
structure, which is fabricated by using the magnetron sputtering, high-temperature …

Electronic devices are extremely sensitive to defects in their constituent semiconductors, but
locating electronic point defects in bulk semiconductors has previously been impossible …