Direct observation of lateral current spreading in ridge waveguide lasers using scanning voltage microscopy

D Ban, EH Sargent, K Hinzer, SJ Dixon-Warren… - Applied physics …, 2003 - pubs.aip.org
We report results of two-dimensional (2D) local voltage measurement of the transverse cross
section of operating multiquantum-well ridge-waveguide (RWG) lasers. We observe lateral …

[引用][C] Kelvin Probe for Surface Engineering: Fund and Design

A Subramanyam - 2010 - Ane Books Pvt Ltd

Scanning voltage microscopy on buried heterostructure multiquantum-well lasers: Identification of a diode current leakage path

D Ban, EH Sargent, DW St J, G Letal… - IEEE journal of …, 2004 - ieeexplore.ieee.org
We report scanning voltage microscopy (SVM) results on actively driven buried
heterostructure (BH) multiquantum-well (MQW) lasers that exhibit current blocking failure at …

Electrostatic force and force gradient microscopy: principles, points of interest and application to characterisation of semiconductor materials and devices

P Girard, AN Titkov - Applied Scanning Probe Methods II: Scanning Probe …, 2006 - Springer
In this paper, the physical principles of local electrical observations and measurements and
related analytical formulas, as well as the optimal experimental conditions for electrical …

Characterization of periodically nanostructured copper filaments self-organized by electrodeposition

Z Wu, YJ Bao, GW Yu, M Wang, RW Peng… - Journal of Physics …, 2006 - iopscience.iop.org
We report in this paper the electric properties of nanostructured copper filament arrays self-
organized by a novel electrochemical method. Due to the spontaneous oscillation of the …

Electrical scanning probe microscopy of electronic and photonic devices: connecting internal mechanisms with external measures

D Ban, B Wen, RS Dhar, SG Razavipour… - Nanotechnology …, 2016 - degruyter.com
The inner workings of semiconductor electronic and photonic devices, such as dopants, free
charge carriers, electric potential, and electric field, are playing a crucial role in the function …

Scanning differential spreading resistance microscopy on actively driven buried heterostructure multiquantum-well lasers

D Ban, EH Sargent, DW St J - IEEE journal of quantum …, 2004 - ieeexplore.ieee.org
We have developed a new scanning probe microscopy-based technique, scanning
differential spreading resistance microscopy (SDSRM), which enables the determination of …

[PDF][PDF] Диагностика наноустройств методами сканирующей зондовой микроскопии

АВ Анкудинов - Иоффе, СПБ, 2015 - researchgate.net
Многие исследователи, использующие сканирующую зондовую микроскопию (СЗМ),
знакомы c историей открытия сканирующей туннельной микроскопии (СТМ), предтечи …

Applications of atomic force microscope (AFM) in the field of nanomaterials and nanocomposites

S Bandyopadhyay, SK Samudrala… - Functional …, 2008 - Springer
Nanotechnology implies the capability to build up tailored nanostructures and devices for
given functions by control at the atomic and molecular levels. Development of novel …

Two‐dimensional profiling of carriers in terahertz quantum cascade lasers using calibrated scanning spreading resistance microscopy and scanning capacitance …

RS Dhar, D Ban - Journal of Microscopy, 2013 - Wiley Online Library
The distribution of charge carriers inside the active region of a terahertz (THz) quantum
cascade laser (QCL) has been measured with scanning spreading resistance microscopy …