We have developed a new scanning probe microscopy-based technique, scanning
differential spreading resistance microscopy (SDSRM) and applied it to profile the free …

What can be learned of the inner workings of semiconductor lasers using properly-
interpreted voltage probing with nanometer resolution? This work makes three …

There has been tremendous development on microscopy techniques based on the scanning
tunneling and atomic force microscopes over the last decades. The aim of this book chapter …

A nanoscopic exploratory measurement technique to measure voltage distribution across an
operating semiconductor device in cryogenic temperature has been developed and …

The contact potential difference (CPD) and surface voltage drop (SVD) has been
investigated on epitaxial detector p+-n− n+—structures using Kelvin Probe Force …

Scanning voltage microscopy and scanning differential resistance microscopy analyses on
diode lasers are presented: the direct observation of the current blocking breakdown in a …