Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …

State‐of‐the‐art scanning probe microscopy (SPM) methods as applied to energy
conversion and storage devices, specifically lithium‐ion batteries, are reviewed with an …

The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was
based on the authors' firm belief that characterization and analysis of surfaces should be …

High-k dielectric layers (⁠ Hf Si x O y and Zr O 2⁠) with different film morphologies were
investigated by tunneling atomic-force microscopy (TUNA). Different current distributions …

This paper gives an overview of established methods and new developments in the field of
Scanning Probe Microscopy (SPM) of functional films and semiconductor devices. It focuses …

Scanning probe microscopy techniques and, in particular, scanning spreading resistance
microscopy (SSRM) were used for a detailed characterization of focused ion beam (FIB) …

The techniques and methods that can be applied to materials characterization on the
microscale are numerous and well-established. Divided into two parts, Characterization of …

The bulk mechanical properties of a blend of elastomers are found to depend on the micro
and nano scale morphology of the phases of the materials in the blend. In this study, we …

Scanning probe microscopy (SPM) has gifted a novel eye to envision nanotechnology and
nanoscience. The SPM technique involves a sharp probe that moves over the sample …

Topography and leakage current maps of TiO2 films grown by atomic layer deposition on
RuO2 electrodes using either a TiCl4 or a Ti (Oi-C3H7) 4 precursor were characterized at …