Electron-concentration dependence of absorption and refraction in n-In0.53Ga0.47As near the band-edge

D Hahn, O Jaschinski, HH Wehmann… - Journal of electronic …, 1995 - Springer
The optical constants of InGaAs were determined as a function of electron concentration in
the range from 10 15 to 2× 10 19 cm− 3 by reflectance-and transmission-spectroscopy. A …

High Resistivity and High Mobility in Localized Beryllium-Doped InAlAs/InGaAs Superlattices Grown at Low Temperature

D Dai, H Liu, X Su, X Shang, S Li, H Ni, Z Niu - Crystals, 2023 - mdpi.com
InAlAs: Be/InGaAs superlattices grown at low temperatures were investigated in this study.
To obtain the highest resistivity and mobility simultaneously, a growth temperature above …

Multi-dimensional optimization of In0.53Ga0.47As thermophotovoltaic cell using real coded genetic algorithm

MMA Gamel, PJ Ker, HJ Lee, WESWA Rashid… - Scientific Reports, 2021 - nature.com
The optimization of thermophotovoltaic (TPV) cell efficiency is essential since it leads to a
significant increase in the output power. Typically, the optimization of In0. 53Ga0. 47As TPV …

Micron-gap thermophotovoltaic systems enhanced by nanowires

MS Mirmoosa, C Simovski - Photonics and Nanostructures-Fundamentals …, 2015 - Elsevier
We introduce new micron-gap thermophotovoltaic systems enhanced by tungsten
nanowires. We theoretically show that these systems allow the frequency-selective super …

Growth of an InGaAs/GaAsSb tunnel junction for an InP-based low band gap tandem solar cell

U Seidel, HJ Schimper, Z Kollonitsch, K Möller… - Journal of crystal …, 2007 - Elsevier
The hetero-interfaces of an InGaAs/GaAsSb tunnel junction, embedded into two InP barrier
layers, as used in a tandem solar cell, were studied. With regard to the sharpness of these …

Energy barriers at interfaces between (100) InxGa1− xAs (≤ x≤ 0.53) and atomic-layer deposited Al2O3 and HfO2

VV Afanas'ev, A Stesmans, G Brammertz… - Applied Physics …, 2009 - pubs.aip.org
The electron energy band alignment at interfaces of In x Ga 1− x As (0≤ x≤ 0.53) with
atomic-layer deposited insulators Al 2 O 3 and HfO 2 is characterized using internal …

Optical constants of In0. 53Ga0. 47As/InP: Experiment and modeling

M Muñoz, TM Holden, FH Pollak, M Kahn… - Journal of applied …, 2002 - pubs.aip.org
The compound In0. 53Ga0. 47As lattice matched to InP is of interest from both applied and
fundamental perspectives. Structures based on In0. 53Ga0. 47As materials have been used …

Modeling and performance of wafer-fused resonant-cavity enhanced photodetectors

IH Tan, EL Hu, JE Bowers… - IEEE journal of quantum …, 1995 - ieeexplore.ieee.org
We discuss wavelength tuning and its corresponding quantum efficiency modulated by the
standing wave effects in a resonant-cavity enhanced (RCE) photodetector. Specific design …

Differential reflection spectroscopy system and method for detecting explosives and other target materials

RE Hummel, AM Fuller, C Schollhorn… - US Patent …, 2008 - Google Patents
BACKGROUND The detection of traces of explosive materials is of utmost importance at the
present time due to the ongoing risk of terrorism. Detection devices should identify …

Determination of Optical Properties of MOVPE-Grown InxGa1-xAs/InP Epitaxial Structures by Spectroscopic Ellipsometry

E Kaynar, M Sayrac, I Altuntas, I Demir - Brazilian Journal of Physics, 2022 - Springer
InxGa1− xAs epitaxial layers with different AsH3 flows have been grown on InP substrate
with the MOVPE system. It has been found that AsH3 flow variation affects the In …