Atomic force microscope (AFM), as a type scanning probe microscope (SPM), offers
advantages that include high resolution, real-time analysis, in-situ imaging, few …

The ability to characterise electrochemical interfaces on a localised scale has revolutionised
our understanding of spatially heterogeneous surface processes. Advances in scanning …

Here, we highlight recent research involving atomic force microscopy investigations of
molecular crystals, and focus particularly on the latest relevant advances in our knowledge …

The transformation of the n-type chromium nitride (CrN) thin films into p-type by intrinsic
point defects using reactive radio frequency magnetron sputtering is explored in this report …

Zn-air batteries (ZABs) are a promising source of renewable energy for portable electronic
devices and automobiles because of low-cost and high energy density. The efficiency of …

Atomic force microscopy (AFM) is an essential nanoinstrument technique for several
applications such as cell biology and nanoelectronics metrology and inspection. The need …

We investigated the properties of a GaN epilayer grown by metalorganic vapour phase
epitaxy on a c-plane bulk GaN substrate obtained by ammonothermal growth. X-ray …

A key hurdle to achieve video-rate atomic force microscopy (AFM) in constant-force contact
mode is the inadequate bandwidth of the vertical feedback control loop. This paper …

Non-raster scanning and undersampling of atomic force microscopy (AFM) images is a
technique for improving imaging rate and reducing the amount of tip–sample interaction …

Localized epitaxy of gallium nitride (GaN) on silicon (Si) is studied, with the aim of achieving
material compatible with 1200 V vertical devices, in particular an unintentional doping level< …