We report on the fabrication of electrically conducting, ultra-sharp, high-aspect ratio probes
for atomic force microscopy by electron-beam-induced deposition of platinum. Probes of …

Integrated sensors are essential for scanning probe microscopy (SPM) based systems that
employ arrays of microcantilevers for high throughput. Common integrated sensors, such as …

Real-space mapping of doping concentration in semiconductor devices is of great
importance for the microelectronics industry. In this work, a scanning microwave impedance …

Polyaniline (PANI) fibers were synthesized in presence of detonantion nanodiamond (DND)
particles by precipitation polymerization technique. Morphological, electrical and …

Connect basic theory with real-world applications with this practical, cross-disciplinary guide
to radio frequency measurement of nanoscale devices and materials.• Learn the techniques …

In the last decade, numerous physical modification methods have been introduced to
enhance triboelectric nanogenerator (TENG) performance although they generally require …

Abstract Three-dimensional (3D) imaging of nanostructures with high aspect ratio features is
a challenging problem of broad relevance to nanoscience and nanotechnology. Though a …

Encapsulated conducting probes that can sustain high currents are used to study the
nanoscale properties of thin-film stacks comprising of a phase-change chalcogenide, Ge 2 …

We present experimental studies of both local and macroscopic electrical effects in uniform
single-(1LG) and bi-layer graphene (2LG) devices as well as in devices with non-uniform …

Semipolar (11 2 2) gallium nitride (GaN) films have been grown on m-plane (1 1 00)
sapphire by epitaxial lateral overgrowth. Transmission electron microscopy (TEM) studies …