It is fundamentally important to understand the nanoscale electronic properties of a single
quantum dot (QD) contrary to an ensemble of QDs. Kelvin probe force microscopy (KPFM) …

A novel positioning concept for high-speed scanning probe microscopy is presented in
which a dual-stage nanopositioner is used for precise positioning over large areas at high …

Control and optimization of optically excited charge and energy transport across solid–liquid
interfaces are essential for many applications including artificial photosynthesis …

The carrier density and carrier density distribution within CdTe solar cells were studied with
scanning capacitance microscopy (SCM). The CdTe solar cells were studied after every …

The monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted
at its end, ie the tip, interacts with a surface, forms the foundation of atomic force microscopy …

Measurement of electrostatic force at the micro-/nanoscale has a great scientific value and
engineering significance. This paper develops a new determination method of electrostatic …

Atomic force microscopy (AFM) has been adopted in both industry and academia for high‐
fidelity, full‐profile topographic characterization. Typically, the tiny tip of the cantilever and …

Atomic force microscopy imaging combined with selective chemical etching is employed to
quantitatively investigate three-dimensional (3D) composition distributions of single GeSi …

Nanoscale structure has a large effect on the optoelectronic properties of InGaN, a material
vital for energy saving technologies such as light emitting diodes. Photoconductive atomic …

Unintentional doping in nonpolar a-plane (11 2 0) gallium nitride (GaN) grown on r-plane (1
1 02) sapphire using a three-dimensional (3D)–two-dimensional (2D) growth method has …