Raman scattering by LO-phonon–plasmon coupled modes in : Role of Landau damping

R Cuscó, E Alarcón-Lladó, L Artús, WS Hurst… - Physical Review B …, 2010 - APS
We present a detailed investigation of the phonons and longitudinal-optical-phonon–
plasmon coupled modes in the Ga 1− x In x As y Sb 1− y alloy by means of Raman …

Raman scattering study of LO phonon–plasmon coupled modes in p-type InGaAs

R Cuscó, N Domènech-Amador, PY Hung… - Journal of Alloys and …, 2015 - Elsevier
We present a Raman scattering study of LO phonon-coupled modes in Be-doped, p-type In
0.53 Ga 0.47 As with hole densities ranging from 2.2× 10 17 to 2.4× 10 19 cm− 3. Two …

Raman spectroscopic study of the electrical properties of 6H–SiC crystals grown by hydrogen-assisted physical vapor transport method

Y Peng, X Xu, X Hu, K Jiang, S Song, Y Gao… - Journal of Applied …, 2010 - pubs.aip.org
Raman spectroscopy has been used to determine the carrier concentration of 6H–SiC
crystal so as to understand the effects of hydrogen on the electrical property of 6H–SiC …

Micro-Raman Spectroscopy Study of Vertical GaN Schottky Diode

AJE N'dohi, C Sonneville, S Saidi, TH Ngo, P De Mierry… - Crystals, 2023 - mdpi.com
In this work, the physical and the electrical properties of vertical GaN Schottky diodes were
investigated. Cathodo-luminescence (CL), micro-Raman spectroscopy, SIMS, and current …

Optical phonon behavior in strain-free dilute Ga (As, N) studied by Raman scattering

J Ibáñez, E Alarcón-Lladó, R Cuscó, L Artús… - Journal of applied …, 2007 - pubs.aip.org
We present a Raman-scattering study on strain-free dilute Ga (As, N) epilayers grown by
molecular beam epitaxy. The aim of our work is to discriminate the effect of alloying from the …

Determination of the carrier density dependent electron effective mass in InN using infrared and Raman spectra

E Tiras, M Tanisli, N Balkan, S Ardali… - … status solidi (b), 2012 - Wiley Online Library
The vibrational properties of InN samples grown by molecular beam epitaxy (MBE)
technique have been studied using infrared (IR) and Raman scattering spectroscopy at …

Analysis of InGaAs/InP pIn Photodiode Failed by Electrostatic Discharge

Y Ito, R Yokogawa, O Ueda, N Sawamoto, K Ide… - Journal of Electronic …, 2023 - Springer
Abstract We have evaluated InGaAs/InP PIN (pIn) photodiodes failed by electrostatic
discharge (ESD) with forward or reverse biasing, using scanning electron microscopy …

Bismuth-content-dependent polarized Raman spectrum of InPBi alloy

GN Wei, QH Tan, X Dai, Q Feng, WG Luo… - Chinese …, 2016 - iopscience.iop.org
We systematically investigate the optical properties of the InP 1− x Bi x ternary alloys with
0≤ x≤ 2.46%, by using high resolution polarized Raman scattering measurement. Both InP …

Исследования полупроводников с дефектами методом комбинационного (рамановского) рассеяния света

ЛА Фальковский - Успехи физических наук, 2004 - ufn.ru
Как известно, основные успехи в экспериментальном изучении фононных спектров
достигнуты много лет назад с помощью тепловых нейтронов. Однако в последнее …

Modification of the Electronic Properties of the n-InP (100) Surface with Sulfide Solutions

MV Lebedev, TV Lvova, AN Smirnov, VY Davydov - Semiconductors, 2021 - Springer
The electronic properties of n-InP (100) surfaces passivated with various sulfide solutions
are studied using photoluminescence and Raman spectroscopy. It is shown that the …