GenStore: A High-Performance and Energy-Efficient In-Storage Computing System for Genome Sequence Analysis

NM Ghiasi, J Park, H Mustafa, J Kim, A Olgun… - arXiv preprint arXiv …, 2022 - arxiv.org
Read mapping is a fundamental, yet computationally-expensive step in many genomics
applications. It is used to identify potential matches and differences between fragments …

A monolithically-integrated chip-to-chip optical link in bulk CMOS

C Sun, M Georgas, J Orcutt, B Moss… - IEEE Journal of Solid …, 2015 - ieeexplore.ieee.org
Silicon-photonics is an emerging technology that can overcome the tradeoffs faced by
traditional electrical I/O. Due to ballooning development costs for advanced CMOS nodes …

Accelerating weather prediction using near-memory reconfigurable fabric

G Singh, D Diamantopoulos, J Gómez-Luna… - ACM Transactions on …, 2022 - dl.acm.org
Ongoing climate change calls for fast and accurate weather and climate modeling. However,
when solving large-scale weather prediction simulations, state-of-the-art CPU and GPU …

A mostly-clean DRAM cache for effective hit speculation and self-balancing dispatch

J Sim, GH Loh, H Kim, M OConnor… - 2012 45th Annual …, 2012 - ieeexplore.ieee.org
Die-stacking technology allows conventional DRAM to be integrated with processors. While
numerous opportunities to make use of such stacked DRAM exist, one promising way is to …

A 1.2 V 8 Gb 8-channel 128 GB/s high-bandwidth memory (HBM) stacked DRAM with effective I/O test circuits

DU Lee, KW Kim, KW Kim, KS Lee… - IEEE Journal of Solid …, 2014 - ieeexplore.ieee.org
Motivated by a graphics memory system that achieves multiplied bandwidth by the number
of memories per system, HBM DRAM adopts a brand new architecture, with many technical …

Challenges and emerging solutions in testing TSV-based 2 1 over 2D-and 3D-stacked ICs

EJ Marinissen - 2012 Design, Automation & Test in Europe …, 2012 - ieeexplore.ieee.org
Through-Silicon Vias (TSVs) provide high-density, low-latency, and low-power vertical
interconnects through a thinned-down wafer substrate, thereby enabling the creation of 2.5 …

Reliability of TSV interconnects: Electromigration, thermal cycling, and impact on above metal level dielectric

T Frank, S Moreau, C Chappaz, P Leduc… - Microelectronics …, 2013 - Elsevier
In this paper, reliability of Through Silicon via (TSV) interconnects is analyzed for two
technologies. First part presents an exhaustive analysis of Cu TSV-last approach of 2μm …

Demystifying the characteristics of 3D-stacked memories: A case study for hybrid memory cube

R Hadidi, B Asgari, BA Mudassar… - 2017 IEEE …, 2017 - ieeexplore.ieee.org
Three-dimensional (3D)-stacking technology, which enables the integration of DRAM and
logic dies, offers high bandwidth and low energy consumption. This technology also …

Large-scale 3D chips: Challenges and solutions for design automation, testing, and trustworthy integration

J Knechtel, O Sinanoglu, IAM Elfadel… - IPSJ Transactions on …, 2017 - jstage.jst.go.jp
Three-dimensional (3D) integration of electronic chips has been advocated by both industry
and academia for many years. It is acknowledged as one of the most promising approaches …

Exploring DRAM organizations for energy-efficient and resilient exascale memories

B Giridhar, M Cieslak, D Duggal, R Dreslinski… - Proceedings of the …, 2013 - dl.acm.org
The power target for exascale supercomputing is 20MW, with about 30% budgeted for the
memory subsystem. Commodity DRAMs will not satisfy this requirement. Additionally, the …