Elementary polarization properties in the backscattering configuration
In the normal incidence backscattering configuration, a polarimetric measurement always
preserves the reciprocal symmetry. For a reciprocal Jones matrix, the number of elementary …
preserves the reciprocal symmetry. For a reciprocal Jones matrix, the number of elementary …
Vector wave imagery using a birefringent lens
S Sanyal, P Bandyopadhyay, A Ghosh - Optical Engineering, 1998 - spiedigitallibrary.org
The imaging characteristics of a birefringent lens sandwiched between two polarizers is
studied analytically. If the optic axis of the birefringent crystal is perpendicular to the lens …
studied analytically. If the optic axis of the birefringent crystal is perpendicular to the lens …
Coating-induced wave-front aberrations: on-axis astigmatism and chromatic aberration in all-reflecting systems
DJ Reiley, RA Chipman - Applied optics, 1994 - opg.optica.org
The coatings used on telescope mirrors and other optical interfaces can have a marked
effect on an optical system's image quality. We describe the wave-front aberrations …
effect on an optical system's image quality. We describe the wave-front aberrations …
Quantitative ellipsometric microscopy at the silicon–air interface
F Linke, R Merkel - Review of scientific instruments, 2005 - pubs.aip.org
Ellipsometry is a versatile optical technique for the investigation of thin films 0.1–300 nm.
Film thickness and refractive index can be obtained rapidly and with high precision …
Film thickness and refractive index can be obtained rapidly and with high precision …
Aberrations of a horizontal–vertical depolarizer
SC McClain, RA Chipman, LW Hillman - Applied optics, 1992 - opg.optica.org
We use ray-trace equations for uniaxial birefringent materials to derive third-order estimates
for aberrations that are produced in imaging through uniaxial plates and horizontal–vertical …
for aberrations that are produced in imaging through uniaxial plates and horizontal–vertical …
Nanometer scale polarimetry studies using a near-field scanning optical microscope
EB McDaniel, SC McClain, JWP Hsu - Applied optics, 1998 - opg.optica.org
We describe a new technique that incorporates polarization modulation into near-field
scanning optical microscopy (NSOM) for nanometer scale polarimetry studies. By using this …
scanning optical microscopy (NSOM) for nanometer scale polarimetry studies. By using this …
Circular polarization beam splitter that uses frustrated total internal reflection by an embedded symmetric achiral multilayer coating
A symmetric achiral trilayer structure, which consists of a high-index center layer
sandwiched between two identical low-index films and embedded in a high-index prism, is …
sandwiched between two identical low-index films and embedded in a high-index prism, is …
Improvement of Resolution and Polarisation Measurement Precision in Biomedical Imaging Through Adaptive Optics
Biomedical polarimetric methods rely upon precise and accurate polarisation measurement,
both in terms of spatial resolution and correctness of vectorial information. However …
both in terms of spatial resolution and correctness of vectorial information. However …
Diffraction image formation in optical systems with polarization aberrations. II: Amplitude response matrices for rotationally symmetric systems
JP McGuire, RA Chipman - JOSA A, 1991 - opg.optica.org
In the previous paper in this series [J. Opt. Soc. Am. A7, 1614 (1990)] a formulation was
established for the calculation and analysis of diffraction image quality in polarizing optical …
established for the calculation and analysis of diffraction image quality in polarizing optical …
Infrared spectropolarimetry
DB Chenault, RA Chipman - Polarization Considerations for …, 1990 - spiedigitallibrary.org
This paper describes the infrared spectropolarimeter currently under development at the
University of Alabama in Huntsville. The instrument, the data acquisition and processing …
University of Alabama in Huntsville. The instrument, the data acquisition and processing …