Fundamentals and applications of plasma cleaning

DPR Thanu, ES Srinadhu, M Zhao, NV Dole… - Developments in surface …, 2019 - Elsevier
Surface treatment is necessary in a host of industries to attain a defect-free surface. In
medical and semiconductor fields, for example, clean surfaces are essential to provide good …

Impact of low-k structure and porosity on etch processes

M Darnon, N Casiez, T Chevolleau, G Dubois… - Journal of Vacuum …, 2013 - pubs.aip.org
The fabrication of interconnects in integrated circuits requires the use of porous low
dielectric constant materials that are unfortunately very sensitive to plasma processes. In this …

Development of a new phase for lab-on-a-chip extraction of polycyclic aromatic hydrocarbons from water

L Foan, J El Sabahy, F Ricoul, B Bourlon… - Sensors and Actuators B …, 2018 - Elsevier
This work reports on the improved performance using nanoporous organosilicate (SiOCH)
for lab‐on-a-chip extraction of organic pollutants from natural waters. Validations were …

Effect of the C-bridge length on the ultraviolet-resistance of oxycarbosilane low-k films

M Redzheb, L Prager, S Naumov, M Krishtab… - Applied Physics …, 2016 - pubs.aip.org
The ultra-violet (UV) and vacuum ultra-violet (VUV) resistance of bridging alkylene groups in
organosilica films has been investigated. Similar to the Si-CH 3 (methyl) bonds, the Si-CH 2 …

Impact des chimies de nettoyage et des traitements plasma sur les matériaux diélectriques à basse permittivité

MJ Lépinay - 2014 - theses.hal.science
Nous présentons dans ce travail l'impact du procédé de fabrication d'un circuit intégré
(nœud technologique 28 nm) sur le matériau diélectrique poreux utilisé pour isoler les …

Analysis of water adsorption in plasma-damaged porous low-k dielectric by controlled-atmosphere infrared spectroscopy

M Darnon, T Chevolleau, C Licitra, N Rochat… - Journal of Vacuum …, 2013 - pubs.aip.org
The integration of porous dielectric (low-k) in interconnects of integrated circuits is limited by
the damage induced by plasma processes to the porous material. Plasma-damaged …

Laser anneal of oxycarbosilane low-k film

M Redzheb, S Armini, K Vanstreels… - 2016 IEEE …, 2016 - ieeexplore.ieee.org
Submilisecond laser anneal has been experimentally investigated for porogen removal and
its ability to improve the mechanical strength in oxycarbosilane ultra low-k films …

Electron and Ion Beam Characterization of Glass

J McKinley - Springer Handbook of Glass, 2019 - Springer
Scientists and engineers have available to them powerful qualitative and quantitative
analytical techniques for the analysis of materials. Specifically, ion and electron beam …

[PDF][PDF] Electroplated Multi-path Compliant Copper Interconnects for Flip-chip Packages

RI Okereke - 2014 - academia.edu
2.2. SCOPE This chapter explores the most prominent first level interconnects common in
today's industry namely: wire-bonding, tape automated bonding and flip-chip bonding …

[PDF][PDF] Ultra-low-k material cryoetching plasma process for interconnects

R Dussart, T Tillocher, F Leroy, P Lefaucheux… - researchgate.net
Ultra-low-k (ULK) dielectrics are a class of insulating materials that act to minimize
capacitance in microelectronic circuits. ULKs are distinguished from ordinary low-k …