Detection method of micro and macro scale defects in silicon carbide castings
J Wang, J Chen, H Shen - Applied Optics, 2024 - opg.optica.org
Aiming at challenges such as low efficiency, high missing rate, difficulty in identifying contour
defects, and difficulty in extracting tiny defects, a defect detection method for extracting micro …
defects, and difficulty in extracting tiny defects, a defect detection method for extracting micro …