Highlights•Review of the application of operando techniques on catalytic reactions.•The
determination of dynamic structure of catalysts under harsh conditions.•Challenge in …

Highlights•Sub-nanometer depth resolution and 50 nm lateral resolution may now be
achieved.•Numerical data processing enables compositional profiling in 2D and sometimes …

Secondary ion mass spectrometry is applied to the depth profiling of the superlattice active
region of lattice matched (∼ 9.2 μm) Al0. 48In0. 52As/In0. 53Ga0. 47As/InP quantum …

The external performance of quantum optoelectronic devices is governed by the three-
dimensional profiles of electric potentials determined by the distribution of charge carriers …

There has been tremendous development on microscopy techniques based on the scanning
tunneling and atomic force microscopes over the last decades. The aim of this book chapter …

A nanoscopic exploratory measurement technique to measure voltage distribution across an
operating semiconductor device in cryogenic temperature has been developed and …