With the advent of sub-nanometer geometries, integrated circuits (ICs) are required to be
checked for newer defects. While scan-based architectures help detect these defects using …

Power dissipation during scan testing of a systemon-chip can be significantly higher than
that during functional mode, causing reliability and yield concerns. This paper proposes a …

While power reduction during testing is necessary for today's low-power devices, it also
lowers test costs. Scan-based methods are the most widely used approach for testing …

The testing of VLSI circuits entitles many challenges in term of area overhead, power and
latency. The Low transition test pattern generation is a very crucial technique for testing of a …

Sažetak Optimizing testing power is a paramount concern in modern digital circuit design,
particularly as the intricacy of circuits continues to rise. This issue becomes even more …

The generation of test patterns for the detection of faults in VLSI circuits is the most integral
part of fault detection. The patterns are generated using Pseudorandom Number Generator …

High temperature during test mode and the large volume of test data are the two prominent
challenges in the testing of System-on-Chip (SoC). Temperature relies on the spatial power …

Advancements in Very Large-Scale Integrated Technology (VLSI) today has made use of
Very Deep Sub-micron (VDSM) technology. This in turn, results in rapid increase in …

The paper demonstrates the circuit of a low power D flip-flop serial in/parallel out (DFF SIPO)
based shift register design. The flip-flops (FF's) consumption of casual logic power in a SoC …

Abstract A power efficient BIST TPG method is proposed to reduce test power dissipation
during scan testing. Before the test patterns are injected into scan chain, the test set adopts a …