Fully-Adjustable Test Signal Generation Module with Multi-Functional Outputs
S Gao, Z Fu, D Kong, L Zou… - 2023 IEEE 16th …, 2023 - ieeexplore.ieee.org
The development of digital technology has driven the progress of the digital field. As a result,
the development and testing of these complex digital systems require integrated test …
the development and testing of these complex digital systems require integrated test …