V Sontakke, J Dickhoff - Bulletin of Electrical Engineering and Informatics, 2023 - beei.org
While power reduction during testing is necessary for today's low-power devices, it also lowers test costs. Scan-based methods are the most widely used approach for testing …
Shodhganga@INFLIBNET: Design and implementation of low power DFT technique for system on chips SoC s Skip navigation DSpace logo Home Browse Universities & …