Advanced Mueller matrix ellipsometry: Instrumentation and emerging applications

XG Chen, HG Gu, JM Liu, C Chen, SY Liu - Science China Technological …, 2022 - Springer
Mueller matrix ellipsometry (MME) provides the 4× 4 Mueller matrix of a sample under test,
which determines how the state of polarization is changed as light interacts with the sample …

Optical transmission, dispersion, and transition behavior of ZnGa2O4 transparent ceramic

B Wang, H Wang, B Tu, K Zheng, H Gu… - Journal of the …, 2023 - Wiley Online Library
As an emerging transparent ceramic with extremely wide transmission range, the unique
optical properties of ZnGa2O4 are of particular interest. In this work, ZnGa2O4 transparent …

Optimal broadband Mueller matrix ellipsometer using multi-waveplates with flexibly oriented axes

H Gu, X Chen, H Jiang, C Zhang, S Liu - Journal of Optics, 2016 - iopscience.iop.org
Accurate measurement of the Mueller matrix over a broad band is highly desirable for the
characterization of nanostructures and nanomaterials. In this paper, we propose a general …

[HTML][HTML] Broadband femtosecond spectroscopic ellipsometry

S Richter, M Rebarz, O Herrfurth, S Espinoza… - Review of Scientific …, 2021 - pubs.aip.org
We present a setup for time-resolved spectroscopic ellipsometry in a pump–probe scheme
using femtosecond laser pulses. As a probe, the system deploys supercontinuum white light …

Study of the retardance of a birefringent waveplate at tilt incidence by Mueller matrix ellipsometer

H Gu, X Chen, C Zhang, H Jiang, S Liu - Journal of Optics, 2017 - iopscience.iop.org
Birefringent waveplates are indispensable optical elements for polarization state
modification in various optical systems. The retardance of a birefringent waveplate will …

Depolarization artifacts in dual rotating-compensator Mueller matrix ellipsometry

W Li, C Zhang, H Jiang, X Chen, S Liu - Journal of Optics, 2016 - iopscience.iop.org
Noticeable depolarization effects are observed in the measurement of the air using an in-
house developed dual rotating-compensator Mueller matrix ellipsometer. We demonstrate …

Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry

H Gu, X Chen, Y Shi, H Jiang, C Zhang, P Gong… - Optics express, 2018 - opg.optica.org
Composite waveplates (CWs) consisting of multiple single waveplates are basic polarization
elements and widely used to manipulate the polarized light in optical systems, and their …

High precision calibration method for a four-axis Mueller matrix polarimeter

J del Hoyo, LM Sanchez-Brea… - Optics and Lasers in …, 2020 - Elsevier
We present a novel method for calibrating a four-axis Mueller matrix polarimeter. This
method is valid even for non-ideal optical elements, as it models all polarization elements …

Development of a spectroscopic Mueller matrix imaging ellipsometer for nanostructure metrology

X Chen, W Du, K Yuan, J Chen, H Jiang… - Review of Scientific …, 2016 - pubs.aip.org
In this paper, we describe the development of a spectroscopic Mueller matrix imaging
ellipsometer (MMIE), which combines the great power of Mueller matrix ellipsometry with the …

Effects of optical activity to Mueller matrix ellipsometry of composed waveplates

D Vala, P Koleják, K Postava, M Kildemo… - Optics …, 2021 - opg.optica.org
Mueller matrix ellipsometry has been used to precisely characterize quartz waveplates for
demanding applications in the semiconductor industry and high precision polarimetry. We …