Helium plasma modification of Si and Si3N4 thin films for advanced etch processes

V Martirosyan, E Despiau-Pujo, J Dubois… - Journal of Vacuum …, 2018 - pubs.aip.org
To achieve the etching of silicon nitride spacers with a perfect anisotropy and an almost
infinite selectivity, an alternative method consisting of two sequential steps—surface …

[图书][B] Plasma Etching Processes for CMOS Devices Realization

N Posseme - 2017 - books.google.com
Plasma etching has long enabled the perpetuation of Moore's Law. Today, etch
compensation helps to create devices that are smaller than 20 nm. But, with the constant …

Development of plasma etching processes to pattern sub-15 nm features with PS-b-PMMA block copolymer masks: Application to advanced CMOS technology

M Delalande, G Cunge, T Chevolleau… - Journal of Vacuum …, 2014 - pubs.aip.org
The best strategies to transfer nanoholes formed from the self-assembly of Polystyren/
Polymethylmethacrylate (PS/PMMA) based block copolymers into a silicon substrate are …

Transients using low-high pulsed power in inductively coupled plasmas

C Qu, SK Nam, MJ Kushner - Plasma Sources Science and …, 2020 - iopscience.iop.org
Pulsed inductively coupled plasmas (ICPs) are widely deployed in the fabrication of
semiconductor devices. Pulse repetition frequencies of up to tens of kHz are commonly used …

Effect of open area ratio and pattern structure on fluctuations in critical dimension and Si recess

N Kuboi, T Tatsumi, M Fukasawa, T Kinoshita… - Journal of Vacuum …, 2013 - pubs.aip.org
The authors quantitatively investigated the effects of open area ratio and pattern structure on
fluctuations in critical dimension (ΔCD) and Si recess depth (Δd R). To model these effects …

Silicon etching in a pulsed HBr/O2 plasma. I. Ion flux and energy analysis

M Haass, M Darnon, G Cunge, O Joubert… - Journal of Vacuum …, 2015 - pubs.aip.org
The ion flux and ion velocity distribution function are studied using a capacitively coupled
radio frequency ion flux probe and a multigrid retarding field analyzer in an HBr/O 2 pulsed …

Microfabrication of piezoelectric MEMS based on thick LiNbO3 single-crystal films

M Ouhabaz, D Belharet, Q Micard, M Costanza… - …, 2024 - iopscience.iop.org
Microfabrication procedure of piezoelectric micro electro-mechanical systems based on 5
μm thick LiNbO 3 films on SiO 2/Si substrate at wafer scale including deep dry etching of …

Patterning of silicon nitride for CMOS gate spacer technology. III. Investigation of synchronously pulsed CH3F/O2/He plasmas

R Blanc, F Leverd, M Darnon, G Cunge… - Journal of Vacuum …, 2014 - pubs.aip.org
Si 3 N 4 spacer etching processes are one of the most critical steps of transistor fabrication
technologies since they must be at the same time very anisotropic to generate straight …

Characterization of dynamic behaviors of defects in Si substrates created by H2 plasma using conductance method

T Kuyama, K Urabe, M Fukawsawa… - Japanese Journal of …, 2020 - iopscience.iop.org
Energetic ion bombardment during plasma etching processes creates latent defects which
play a role as carrier trapping/de-trapping sites in materials. In this study, we investigated the …

Silicon etching in a pulsed HBr/O2 plasma. II. Pattern transfer

M Haass, M Darnon, G Cunge, O Joubert - Journal of Vacuum Science …, 2015 - pubs.aip.org
The strong impact of synchronized plasma pulsing on an HBr/O 2 silicon pattern etch
process is studied with respect to the continuous process. This article focuses on blanket …