Deep learning for smart industry: Efficient manufacture inspection system with fog computing

L Li, K Ota, M Dong - IEEE Transactions on Industrial …, 2018 - ieeexplore.ieee.org
With the rapid development of Internet of things devices and network infrastructure, there
have been a lot of sensors adopted in the industrial productions, resulting in a large size of …

An adaptive image steganography approach depending on integer wavelet transform and genetic algorithm

S Pramanik - Multimedia Tools and Applications, 2023 - Springer
Steganography is the art and a science of obscuring the presence of communication by
hiding content in electronic media and so obscuring the presence of communication from the …

Adaptive image steganography based on transform domain via genetic algorithm

A Miri, K Faez - Optik, 2017 - Elsevier
This paper presents a novel approach for data hiding in frequency domain with the use of
genetic algorithm. At first, cover images are mapped to a proper frequency domain using the …

An image steganography method based on integer wavelet transform

A Miri, K Faez - Multimedia Tools and Applications, 2018 - Springer
This paper presents a novel approach for Image steganography based on Integer Wavelet
Transform. In this method, the cover image is mapped to a specific frequency domain. Then …

Medical image denoising based on 2D discrete cosine transform via ant colony optimization

A Miri, S Sharifian, S Rashidi, M Ghods - Optik, 2018 - Elsevier
In medical imaging, researchers usually encounter with different types of noise; for
eliminating this noise, different methods have been suggested in both spatial and frequency …

Industrial Environmental Monitoring and Rectifying System

V Chithra, B Karthikeyan… - … Conference on Power …, 2022 - ieeexplore.ieee.org
The creation of embedded systems has shown to be a dependable method for keeping track
of and improving the industrial environment. The project's aim is to create a structure that …

Defect detection on IC wafers based on neural network

A Abedini, M Ehsanian - 2017 29th International Conference on …, 2017 - ieeexplore.ieee.org
In many researches, defects are detected with using reference image. But recently, detection
of defects without reference image is considered. Because Automated visual examination …