TF Tan, LK Loh, D Lubomirsky, J Soonwook… - US Patent …, 2019 - Google Patents
Semiconductor systems and methods may include a semi conductor processing chamber having a gas box defining an access to the semiconductor processing chamber. The cham …
W Fung, M Liang, A Chandrashekar - US Patent 9,978,610, 2018 - Google Patents
Methods and apparatuses for filling features with metal materials such as tungsten- containing materials in a substantially void-free manner are provided. In certain …
D Lubomirsky - US Patent 10,546,729, 2020 - Google Patents
Described processing chambers may include a chamber housing at least partially defining an interior region of the semiconductor processing chamber. The chambers may include a …
D Lubomirsky, X Chen, S Venkataraman - US Patent 10,256,079, 2019 - Google Patents
An exemplary system may include a chamber configured to contain a semiconductor substrate in a processing region of the chamber. The system may include a first remote …
A Chandrashekar, E Jeng, R Humayun… - US Patent …, 2017 - Google Patents
Sten and related systems and apparatus. The methods include inside-out fill techniques as well as conformal deposition in features. Inside-out fill techniques can include selective …
J Yang, B Zhou, M Shen, T Lill, J Hoang - US Patent 9,870,899, 2018 - Google Patents
Methods of etching cobalt on substrates are provided. Some methods involve exposing the substrate to a boron-containing halide gas and an additive, and exposing the substrate to an …
S Tan, J Yu, R Wise, N Shamma, Y Pan - US Patent 10,269,566, 2019 - Google Patents
Methods of and apparatuses for processing substrates having carbon-containing material using atomic layer deposition and selective deposition are provided. Methods involve …
JG Yang, ML Miller, X Chen, KN Chuc, Q Liang… - US Patent …, 2019 - Google Patents
Substrate processing systems are described that have a capacitively coupled plasma (CCP) unit positioned inside a process chamber. The CCP unit may include a plasma excitation …